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Sridhar Mahendrakar
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Clifton Park, NY, US
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Patents Grants
last 30 patents
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Patent Grant
Measuring complex structures in semiconductor fabrication
Patent number
10,664,638
Issue date
May 26, 2020
GLOBALFOUNDRIES Inc.
Taher Kagalwala
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Measurement system and method for measuring in thin films
Patent number
10,030,971
Issue date
Jul 24, 2018
Globalfoundries, Inc.
Cornel Bozdog
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
MEASURING COMPLEX STRUCTURES IN SEMICONDUCTOR FABRICATION
Publication number
20200192987
Publication date
Jun 18, 2020
GLOBALFOUNDRIES INC.
TAHER KAGALWALA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MEASUREMENT SYSTEM AND METHOD FOR MEASURING IN THIN FILMS
Publication number
20170038201
Publication date
Feb 9, 2017
GLOBALFOUNDRIES, INC.
Cornel Bozdog
G01 - MEASURING TESTING