Srikanth Jagannathan

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting faults in an analog input/output...
- Patent number 11,561,255
- Issue date Jan 24, 2023
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit configured to determine a test voltage suitable for very lo...
- Patent number 11,519,960
- Issue date Dec 6, 2022
- NXP USA, INC.
- Srikanth Jagannathan
- G01 - MEASURING TESTING
Information Patent Grant
Protection circuit
- Patent number 11,196,411
- Issue date Dec 7, 2021
- NXP USA, INC.
- Srikanth Jagannathan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Glitch profiling in an integrated circuit
- Patent number 11,164,648
- Issue date Nov 2, 2021
- NXP USA, INC.
- Nihaar N. Mahatme
- G01 - MEASURING TESTING
Information Patent Grant
Pad protection in an integrated circuit
- Patent number 11,146,057
- Issue date Oct 12, 2021
- NXP USA, INC.
- Kumar Abhishek
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Stress test on circuit with low voltage transistor
- Patent number 11,099,231
- Issue date Aug 24, 2021
- NXP USA, INC.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Differential output driver circuit and method of operation
- Patent number 11,075,636
- Issue date Jul 27, 2021
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Low power mode testing in an integrated circuit
- Patent number 11,047,904
- Issue date Jun 29, 2021
- NXP USA, INC.
- Kumar Abhishek
- G01 - MEASURING TESTING
Information Patent Grant
Embedded continuity test circuit
- Patent number 10,955,467
- Issue date Mar 23, 2021
- NXP USA, INC.
- Kumar Abhishek
- G01 - MEASURING TESTING
Information Patent Grant
Analog to digital converter
- Patent number 10,763,880
- Issue date Sep 1, 2020
- NXP USA, INC.
- Christopher James Micielli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transmitter circuit having a pre-emphasis driver circuit
- Patent number 10,734,974
- Issue date Aug 4, 2020
- NXP USA, INC.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
SRAM based physically unclonable function and method for generating...
- Patent number 10,734,047
- Issue date Aug 4, 2020
- NXP USA, INC.
- Nihaar N. Mahatme
- G11 - INFORMATION STORAGE
Information Patent Grant
Circuit with analog-to-digital converters of different conversion r...
- Patent number 10,700,691
- Issue date Jun 30, 2020
- NXP USA, INC.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Comparator circuit with feedback and method of operation
- Patent number 10,680,594
- Issue date Jun 9, 2020
- NXP USA, INC.
- Christopher James Micielli
- G01 - MEASURING TESTING
Information Patent Grant
Amplifier with hysteresis
- Patent number 10,418,952
- Issue date Sep 17, 2019
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Fault detection in a low voltage differential signaling (LVDS) system
- Patent number 10,361,732
- Issue date Jul 23, 2019
- NXP USA, INC.
- Srikanth Jagannathan
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Analog-to-digital conversion with sampling capacitor pre-charging
- Patent number 10,312,929
- Issue date Jun 4, 2019
- NXP USA, INC.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Grant
Level shifter having constant duty cycle across process, voltage, a...
- Patent number 10,205,441
- Issue date Feb 12, 2019
- NXP USA, INC.
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Robust boot block design and architecture
- Patent number 10,157,087
- Issue date Dec 18, 2018
- NXP USA, INC.
- Kumar Abhishek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuitry and methods for reducing leakage current
- Patent number 10,153,768
- Issue date Dec 11, 2018
- NXP USA, INC.
- Christopher James Micielli
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
On chip adaptive jitter reduction hardware method for LVDS systems
- Patent number 10,148,261
- Issue date Dec 4, 2018
- NXP USA, INC.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Devices and methods for power sequence detection
- Patent number 10,013,042
- Issue date Jul 3, 2018
- NXP USA, INC.
- Kumar Abhishek
- G11 - INFORMATION STORAGE
Information Patent Grant
SRAM based physically unclonable function and method for generating...
- Patent number 9,947,391
- Issue date Apr 17, 2018
- NXP USA, INC.
- Nihaar N. Mahatme
- G11 - INFORMATION STORAGE
Information Patent Grant
Devices and methods with capacitive storage for latch redundancy
- Patent number 9,559,671
- Issue date Jan 31, 2017
- NXP USA, INC.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
DIFFERENTIAL INPUT RECEIVER CIRCUIT TESTING WITH A LOOPBACK CIRCUIT
- Publication number 20230033973
- Publication date Feb 2, 2023
- Kumar Abhishek
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...
- Publication number 20220334176
- Publication date Oct 20, 2022
- Kumar Abhishek
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CIRCUIT CONFIGURED TO DETERMINE A TEST VOLTAGE SUITABLE FOR VERY LO...
- Publication number 20220057448
- Publication date Feb 24, 2022
- NXP USA, Inc.
- Srikanth Jagannathan
- G01 - MEASURING TESTING
Information Patent Application
STRESS TEST ON CIRCUIT WITH LOW VOLTAGE TRANSISTOR
- Publication number 20210096170
- Publication date Apr 1, 2021
- NXP USA, Inc.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
GLITCH PROFILING IN AN INTEGRATED CIRCUIT
- Publication number 20200402602
- Publication date Dec 24, 2020
- NXP USA, Inc.
- Nihaar N. Mahatme
- G01 - MEASURING TESTING
Information Patent Application
LOW POWER MODE TESTING IN AN INTEGRATED CIRCUIT
- Publication number 20200284830
- Publication date Sep 10, 2020
- NXP USA, Inc.
- Kumar ABHISHEK
- G01 - MEASURING TESTING
Information Patent Application
ANALOG TO DIGITAL CONVERTER
- Publication number 20200266825
- Publication date Aug 20, 2020
- NXP USA, Inc.
- Christopher James MICIELLI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PROTECTION CIRCUIT
- Publication number 20200259487
- Publication date Aug 13, 2020
- NXP USA, Inc.
- Srikanth Jagannathan
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SRAM BASED PHYSICALLY UNCLONABLE FUNCTION AND METHOD FOR GENERATING...
- Publication number 20200243122
- Publication date Jul 30, 2020
- NXP USA, Inc.
- NIHAAR N. MAHATME
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
EMBEDDED CONTINUITY TEST CIRCUIT
- Publication number 20200191862
- Publication date Jun 18, 2020
- NXP USA, Inc.
- Kumar ABHISHEK
- G01 - MEASURING TESTING
Information Patent Application
PAD PROTECTION IN AN INTEGRATED CIRCUIT
- Publication number 20200136373
- Publication date Apr 30, 2020
- NXP USA, Inc.
- KUMAR ABHISHEK
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
COMPARATOR CIRCUIT WITH FEEDBACK AND METHOD OF OPERATION
- Publication number 20200021279
- Publication date Jan 16, 2020
- NXP USA, Inc.
- CHRISTOPHER JAMES MICIELLI
- G01 - MEASURING TESTING
Information Patent Application
AMPLIFIER WITH HYSTERESIS
- Publication number 20190288654
- Publication date Sep 19, 2019
- NXP USA, Inc.
- KUMAR ABHISHEK
- H03 - BASIC ELECTRONIC CIRCUITRY

Srikanth Jagannathan

Person

Patents Grantslast 30 patents

Systems and methods for detecting faults in an analog input/output...

Circuit configured to determine a test voltage suitable for very lo...

Protection circuit

Glitch profiling in an integrated circuit

Pad protection in an integrated circuit

Stress test on circuit with low voltage transistor

Differential output driver circuit and method of operation

Low power mode testing in an integrated circuit

Embedded continuity test circuit

Analog to digital converter

Transmitter circuit having a pre-emphasis driver circuit

SRAM based physically unclonable function and method for generating...

Circuit with analog-to-digital converters of different conversion r...

Comparator circuit with feedback and method of operation

Amplifier with hysteresis

Fault detection in a low voltage differential signaling (LVDS) system

Analog-to-digital conversion with sampling capacitor pre-charging

Level shifter having constant duty cycle across process, voltage, a...

Robust boot block design and architecture

Integrated circuitry and methods for reducing leakage current

On chip adaptive jitter reduction hardware method for LVDS systems

Devices and methods for power sequence detection

SRAM based physically unclonable function and method for generating...

Devices and methods with capacitive storage for latch redundancy

Patents Applicationslast 30 patents

DIFFERENTIAL INPUT RECEIVER CIRCUIT TESTING WITH A LOOPBACK CIRCUIT

SYSTEMS AND METHODS FOR DETECTING FAULTS IN AN ANALOG INPUT/OUTPUT...

CIRCUIT CONFIGURED TO DETERMINE A TEST VOLTAGE SUITABLE FOR VERY LO...

STRESS TEST ON CIRCUIT WITH LOW VOLTAGE TRANSISTOR

GLITCH PROFILING IN AN INTEGRATED CIRCUIT

LOW POWER MODE TESTING IN AN INTEGRATED CIRCUIT

ANALOG TO DIGITAL CONVERTER

PROTECTION CIRCUIT

SRAM BASED PHYSICALLY UNCLONABLE FUNCTION AND METHOD FOR GENERATING...

EMBEDDED CONTINUITY TEST CIRCUIT

PAD PROTECTION IN AN INTEGRATED CIRCUIT

COMPARATOR CIRCUIT WITH FEEDBACK AND METHOD OF OPERATION

AMPLIFIER WITH HYSTERESIS