Srikanth Krishnan

Person

Richardson, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for qualifying HEMT FET devices
- Patent number 9,476,933
- Issue date Oct 25, 2016
- Texas Instruments Incorporated
- Jungwoo Joh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Budgeting electromigration-related reliability among metal paths in...
- Patent number 8,219,953
- Issue date Jul 10, 2012
- Texas Instruments Incorporated
- Palkesh Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Segmented power amplifier with varying segment activation
- Patent number 8,138,829
- Issue date Mar 20, 2012
- Texas Instruments Incorporated
- Vijay Kumar Reddy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methodology for assessing degradation due to radio frequency excita...
- Patent number 7,974,595
- Issue date Jul 5, 2011
- Texas Instruments Incorporated
- Vijay Kumar Reddy
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating the effects of stress on an RF...
- Patent number 7,808,266
- Issue date Oct 5, 2010
- Texas Instruments Incorporated
- Andrew Marsall
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit modeling, design, and fabrication based on degra...
- Patent number 7,750,400
- Issue date Jul 6, 2010
- Texas Instruments Incorporated
- Ajit Shanware
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for reducing charge damage in silicon-on-insulato...
- Patent number 7,638,412
- Issue date Dec 29, 2009
- Texas Instruments Incorporated
- James D. Gallia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for reducing charge damage in silicon-on-insulato...
- Patent number 7,262,468
- Issue date Aug 28, 2007
- Texas Instruments Incorporated
- James D. Gallia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for accurate negative bias temperature instabilit...
- Patent number 7,218,132
- Issue date May 15, 2007
- Texas Instruments Incorporated
- Anand T. Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
System and method for accurate negative bias temperature instabilit...
- Patent number 7,212,023
- Issue date May 1, 2007
- Texas Instruments Incorporated
- Anand T. Krishnan
- G01 - MEASURING TESTING
Information Patent Grant
Two step semiconductor manufacturing process for copper interconnects
- Patent number 7,122,466
- Issue date Oct 17, 2006
- Texas Instruments Incorporated
- Young-Joon Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing antenna proximity lines
- Patent number 7,071,092
- Issue date Jul 4, 2006
- Texas Instruments Incorporated
- Anand T. Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mechanical cooling fin for interconnects
- Patent number 7,031,163
- Issue date Apr 18, 2006
- Texas Instruments Incorporated
- Ki-Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit having antenna proximity lines coupled to the se...
- Patent number 6,969,902
- Issue date Nov 29, 2005
- Texas Instruments Incorporated
- Anand T. Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit insulator and method
- Patent number 6,962,883
- Issue date Nov 8, 2005
- Texas Instruments Incorporated
- Somnath S. Nag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photoconductive thin film for reduction of plasma damage
- Patent number 6,770,937
- Issue date Aug 3, 2004
- Texas Instruments Incorporated
- Anand Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transient fuse for charge-induced damage detection
- Patent number 6,586,267
- Issue date Jul 1, 2003
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication technique for controlled incorporation of nitrogen in g...
- Patent number 6,399,445
- Issue date Jun 4, 2002
- Texas Instruments Incorporated
- Sunil V. Hattangady
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transient fuse for change-induced damage detection
- Patent number 6,396,075
- Issue date May 28, 2002
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bistable fuse by amorphization of polysilicon
- Patent number 6,117,745
- Issue date Sep 12, 2000
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process related damage monitor (predator)--systematic variation of...
- Patent number 6,016,062
- Issue date Jan 18, 2000
- Texas Instruments Incorporated
- Paul Nicollian
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Protection structures for the suppression of plasma damage
- Patent number 5,998,299
- Issue date Dec 7, 1999
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma emission triggered protection device for protecting against...
- Patent number 5,994,742
- Issue date Nov 30, 1999
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting defects in insulative layers of...
- Patent number 5,739,052
- Issue date Apr 14, 1998
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for detecting defects in insulative layers of...
- Patent number 5,596,207
- Issue date Jan 21, 1997
- Texas Instruments Incorporated
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
HIGH VOLTAGE FINGER LAYOUT TRANSISTOR
- Publication number 20230061337
- Publication date Mar 2, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Jungwoo Joh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Methods for Qualifying HEMT FET Devices
- Publication number 20150160285
- Publication date Jun 11, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Jungwoo Joh
- G01 - MEASURING TESTING
Information Patent Application
Segmented Power Amplifier with Varying Segment Activation
- Publication number 20110291754
- Publication date Dec 1, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Vijay Kumar Reddy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...
- Publication number 20100164533
- Publication date Jul 1, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Andrew Marshall
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT MODELING, DESIGN, AND FABRICATION BASED ON DEGRA...
- Publication number 20100038683
- Publication date Feb 18, 2010
- Texas Instruments Inc.
- Ajit Shanware
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Budgeting Electromigration-Related Reliability Among Metal Paths In...
- Publication number 20090187869
- Publication date Jul 23, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Palkesh Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODOLOGY FOR ASSESSING DEGRADATION DUE TO RADIO FREQUENCY EXCITA...
- Publication number 20090167429
- Publication date Jul 2, 2009
- TEXAS INSTRUMENTS INCORPORATED
- Vijay Kumar Reddy
- G01 - MEASURING TESTING
Information Patent Application
Method and system for reducing charge damage in silicon-on-insulato...
- Publication number 20070264804
- Publication date Nov 15, 2007
- TEXAS INSTRUMENTS INCORPORATED
- James D. Gallia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for accurate negative bias temperature instabilit...
- Publication number 20060076971
- Publication date Apr 13, 2006
- Anand T. Krishnan
- G01 - MEASURING TESTING
Information Patent Application
System and method for accurate negative bias temperature instabilit...
- Publication number 20060049842
- Publication date Mar 9, 2006
- Anand T. Krishnan
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor antenna proximity lines
- Publication number 20050133826
- Publication date Jun 23, 2005
- Anand T. Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Two step semiconductor manufacturing process for copper interconnects
- Publication number 20050023688
- Publication date Feb 3, 2005
- Young-Joon Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated circuit insulator and method
- Publication number 20040259384
- Publication date Dec 23, 2004
- Somnath S. Nag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor antenna proximity lines
- Publication number 20040183102
- Publication date Sep 23, 2004
- Anand T. Krishnan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mechanical cooling fin for interconnects
- Publication number 20040125572
- Publication date Jul 1, 2004
- Ki-Don Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for predicting the degradation of an integrated circuit perf...
- Publication number 20030233624
- Publication date Dec 18, 2003
- TEXAS INSTRUMENTS INCORPORATED
- Vijay K. Reddy
- G01 - MEASURING TESTING
Information Patent Application
Method and system for reducing charge damage in silicon-on-insulato...
- Publication number 20030122190
- Publication date Jul 3, 2003
- TEXAS INSTRUMENTS INCORPORATED
- James D. Gallia
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transient fuse for charge-induced damage detection
- Publication number 20020088999
- Publication date Jul 11, 2002
- Srikanth Krishnan
- H01 - BASIC ELECTRIC ELEMENTS

Srikanth Krishnan

Person

Patents Grantslast 30 patents

Apparatus and methods for qualifying HEMT FET devices

Budgeting electromigration-related reliability among metal paths in...

Segmented power amplifier with varying segment activation

Methodology for assessing degradation due to radio frequency excita...

Method and apparatus for evaluating the effects of stress on an RF...

Integrated circuit modeling, design, and fabrication based on degra...

Method and system for reducing charge damage in silicon-on-insulato...

Method and system for reducing charge damage in silicon-on-insulato...

System and method for accurate negative bias temperature instabilit...

System and method for accurate negative bias temperature instabilit...

Two step semiconductor manufacturing process for copper interconnects

Method of manufacturing antenna proximity lines

Mechanical cooling fin for interconnects

Integrated circuit having antenna proximity lines coupled to the se...

Integrated circuit insulator and method

Photoconductive thin film for reduction of plasma damage

Transient fuse for charge-induced damage detection

Fabrication technique for controlled incorporation of nitrogen in g...

Transient fuse for change-induced damage detection

Bistable fuse by amorphization of polysilicon

Process related damage monitor (predator)--systematic variation of...

Protection structures for the suppression of plasma damage

Plasma emission triggered protection device for protecting against...

Apparatus and method for detecting defects in insulative layers of...

Apparatus and method for detecting defects in insulative layers of...

Patents Applicationslast 30 patents

HIGH VOLTAGE FINGER LAYOUT TRANSISTOR

Apparatus and Methods for Qualifying HEMT FET Devices

Segmented Power Amplifier with Varying Segment Activation

METHOD AND APPARATUS FOR EVALUATING THE EFFECTS OF STRESS ON AN RF...

INTEGRATED CIRCUIT MODELING, DESIGN, AND FABRICATION BASED ON DEGRA...

Budgeting Electromigration-Related Reliability Among Metal Paths In...

METHODOLOGY FOR ASSESSING DEGRADATION DUE TO RADIO FREQUENCY EXCITA...

Method and system for reducing charge damage in silicon-on-insulato...

System and method for accurate negative bias temperature instabilit...

System and method for accurate negative bias temperature instabilit...

Semiconductor antenna proximity lines

Two step semiconductor manufacturing process for copper interconnects

Integrated circuit insulator and method

Semiconductor antenna proximity lines

Mechanical cooling fin for interconnects

Method for predicting the degradation of an integrated circuit perf...

Method and system for reducing charge damage in silicon-on-insulato...

Transient fuse for charge-induced damage detection