Srikanth Sundararajan

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for storing and retrieving semiconductor tester i...
- Patent number 8,725,748
- Issue date May 13, 2014
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G01 - MEASURING TESTING
Information Patent Grant
Efficient storage of fail data to aid in fault isolation
- Patent number 7,634,127
- Issue date Dec 15, 2009
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storage of descriptive information in user defined fields of failur...
- Patent number 7,529,988
- Issue date May 5, 2009
- Advanced Micro Devices, Inc.
- Srikanth Sundararajan
- G11 - INFORMATION STORAGE
Information Patent Grant
Wafer level global bitmap characterization in integrated circuit te...
- Patent number 7,137,085
- Issue date Nov 14, 2006
- Advanced Micro Devices, Inc.
- John J. Wang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and system for managing component changes to a business crit...
- Publication number 20020072928
- Publication date Jun 13, 2002
- Srikanth Sundararajan
- G06 - COMPUTING CALCULATING COUNTING