Srinivas Rao Doddi

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Modeling behavior in a network
- Patent number 10,630,706
- Issue date Apr 21, 2020
- VMware, Inc.
- Ravi Kumar Devi Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Security feature extraction for a network
- Patent number 10,389,742
- Issue date Aug 20, 2019
- VMware, Inc.
- Ravi Kumar Devi Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting security threats in a local network
- Patent number 10,305,922
- Issue date May 28, 2019
- VMware, Inc.
- Ravi Kumar Devi Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for model-based design and layout of an integrate...
- Patent number 8,677,301
- Issue date Mar 18, 2014
- Cadence Design Systems, Inc.
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for model-based design and layout of an integrate...
- Patent number 8,645,887
- Issue date Feb 4, 2014
- Cadence Design Systems, Inc.
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, method and computer program product for comprehensive collu...
- Patent number 8,561,184
- Issue date Oct 15, 2013
- Adometry, Inc.
- Robert Lee Marsa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System, method and computer program product for collusion detection
- Patent number 8,533,825
- Issue date Sep 10, 2013
- Adometry, Inc.
- Robert Lee Marsa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for model-based design and layout of an integrate...
- Patent number 8,381,152
- Issue date Feb 19, 2013
- Cadence Design Systems, Inc.
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods, systems, and computer program product for implementing hot...
- Patent number 8,302,052
- Issue date Oct 30, 2012
- Cadence Design Systems, Inc.
- Brian Lee
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Optical metrology of structures formed on semiconductor wafers usin...
- Patent number 7,831,528
- Issue date Nov 9, 2010
- Tokyo Electron Limited
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Selecting a profile model for use in optical metrology using a mach...
- Patent number 7,523,076
- Issue date Apr 21, 2009
- Tokyo Electron Limited
- Emmanuel Drege
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Model and parameter selection for optical metrology
- Patent number 7,505,153
- Issue date Mar 17, 2009
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,474,993
- Issue date Jan 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Optimization of diffraction order selection for two-dimensional str...
- Patent number 7,428,060
- Issue date Sep 23, 2008
- Timbre Technologies, Inc.
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Grant
Selecting a hypothetical profile to use in optical metrology
- Patent number 7,394,554
- Issue date Jul 1, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Model and parameter selection for optical metrology
- Patent number 7,330,279
- Issue date Feb 12, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Selection of wavelengths for integrated circuit optical metrology
- Patent number 7,216,045
- Issue date May 8, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Grant
Clustering for data compression
- Patent number 6,857,114
- Issue date Feb 15, 2005
- Timbre Technologies, Inc.
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metrology hardware adaptation with universal library
- Patent number 6,853,942
- Issue date Feb 8, 2005
- Timbre Technologies, Inc.
- Emmanuel Drege
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit profile value determination
- Patent number 6,842,261
- Issue date Jan 11, 2005
- Timbre Technologies, Inc.
- Junwei Bao
- G01 - MEASURING TESTING
Information Patent Grant
System and method for grating profile classification
- Patent number 6,636,843
- Issue date Oct 21, 2003
- Timbre Technologies, Inc.
- Srinivas Doddi
- G02 - OPTICS
Information Patent Grant
Profile refinement for integrated circuit metrology
- Patent number 6,609,086
- Issue date Aug 19, 2003
- Timbre Technologies, Inc.
- Junwei Bao
- G01 - MEASURING TESTING
Information Patent Grant
Clustering for data compression
- Patent number 6,591,405
- Issue date Jul 8, 2003
- Timbre Technologies, Inc.
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MODELING BEHAVIOR IN A NETWORK
- Publication number 20170118237
- Publication date Apr 27, 2017
- E8 Security, Inc.
- Ravi Kumar Devi Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SECURITY FEATURE EXTRACTION FOR A NETWORK
- Publication number 20170118236
- Publication date Apr 27, 2017
- E8 Security, Inc.
- Ravi Kumar Devi Reddy
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DETECTING SECURITY THREATS IN A LOCAL NETWORK
- Publication number 20170118240
- Publication date Apr 27, 2017
- E8 Security, Inc.
- Ravi Kumar Devi Reddy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...
- Publication number 20120272201
- Publication date Oct 25, 2012
- Cadence Design Systems, Inc.
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...
- Publication number 20120272200
- Publication date Oct 25, 2012
- Cadence Design Systems, Inc.
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING HOT...
- Publication number 20100324878
- Publication date Dec 23, 2010
- Cadence Design Systems, Inc.
- Brian LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...
- Publication number 20090307642
- Publication date Dec 10, 2009
- Ya-Chieh Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL METROLOGY OF STRUCTURES FORMED ON SEMICONDUCTOR WAFERS USIN...
- Publication number 20090198635
- Publication date Aug 6, 2009
- Timbre Technologies, Inc.
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY
- Publication number 20080151269
- Publication date Jun 26, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optimization of diffraction order selection for two-dimensional str...
- Publication number 20070223011
- Publication date Sep 27, 2007
- Timbre Technologies, Inc.
- Wen Jin
- G01 - MEASURING TESTING
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20070198211
- Publication date Aug 23, 2007
- Timbre Technologies, Inc.
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Selecting a profile model for use in optical metrology using a mach...
- Publication number 20050192914
- Publication date Sep 1, 2005
- Timbre Technologies, Inc.
- Emmanuel Drege
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical metrology of structures formed on semiconductor wafer using...
- Publication number 20040267397
- Publication date Dec 30, 2004
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Diffraction order selection for optical metrology simulation
- Publication number 20040090629
- Publication date May 13, 2004
- Emmanuel Drege
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit profile value determination
- Publication number 20040039473
- Publication date Feb 26, 2004
- Junwei Bao
- G01 - MEASURING TESTING
Information Patent Application
Model and parameter selection for optical metrology
- Publication number 20040017574
- Publication date Jan 29, 2004
- Vi Vuong
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Selection of wavelengths for integrated circuit optical metrology
- Publication number 20030225535
- Publication date Dec 4, 2003
- Srinivas Doddi
- G01 - MEASURING TESTING
Information Patent Application
Clustering for data compression
- Publication number 20030188279
- Publication date Oct 2, 2003
- Srinivas Doddi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology hardware adaptation with universal library
- Publication number 20030187604
- Publication date Oct 2, 2003
- Emmanuel Drege
- G01 - MEASURING TESTING
Information Patent Application
System and method for grating profile classification
- Publication number 20020188580
- Publication date Dec 12, 2002
- TIMBRE TECHNOLOGIES, INC.
- Srinivas Doddi
- G02 - OPTICS

Srinivas Rao Doddi

Person

Patents Grantslast 30 patents

Modeling behavior in a network

Security feature extraction for a network

Detecting security threats in a local network

Method and system for model-based design and layout of an integrate...

Method and system for model-based design and layout of an integrate...

System, method and computer program product for comprehensive collu...

System, method and computer program product for collusion detection

Method and system for model-based design and layout of an integrate...

Methods, systems, and computer program product for implementing hot...

Optical metrology of structures formed on semiconductor wafers usin...

Selecting a profile model for use in optical metrology using a mach...

Model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

Optimization of diffraction order selection for two-dimensional str...

Selecting a hypothetical profile to use in optical metrology

Model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

Clustering for data compression

Metrology hardware adaptation with universal library

Integrated circuit profile value determination

System and method for grating profile classification

Profile refinement for integrated circuit metrology

Clustering for data compression

Patents Applicationslast 30 patents

MODELING BEHAVIOR IN A NETWORK

SECURITY FEATURE EXTRACTION FOR A NETWORK

DETECTING SECURITY THREATS IN A LOCAL NETWORK

METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...

METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...

METHODS, SYSTEMS, AND COMPUTER PROGRAM PRODUCT FOR IMPLEMENTING HOT...

METHOD AND SYSTEM FOR MODEL-BASED DESIGN AND LAYOUT OF AN INTEGRATE...

OPTICAL METROLOGY OF STRUCTURES FORMED ON SEMICONDUCTOR WAFERS USIN...

MODEL AND PARAMETER SELECTION FOR OPTICAL METROLOGY

Optimization of diffraction order selection for two-dimensional str...

Selection of wavelengths for integrated circuit optical metrology

Selecting a profile model for use in optical metrology using a mach...

Optical metrology of structures formed on semiconductor wafer using...

Diffraction order selection for optical metrology simulation

Integrated circuit profile value determination

Model and parameter selection for optical metrology

Selection of wavelengths for integrated circuit optical metrology

Clustering for data compression

Metrology hardware adaptation with universal library

System and method for grating profile classification