Srinivasan Rangarajan

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Hopewell Junction, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic peak tracking in X-ray photoelectron spectroscopy measureme...
- Patent number 9,080,948
- Issue date Jul 14, 2015
- International Business Machines Corporation
- Bing Sun
- G01 - MEASURING TESTING
Information Patent Grant
Alignment of wafers for 3D integration
- Patent number 8,299,584
- Issue date Oct 30, 2012
- International Business Machines Corporation
- Dmitriy Shneyder
- B32 - LAYERED PRODUCTS

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC PEAK TRACKING IN X-RAY PHOTOELECTRON SPECTROSCOPY MEASUREME...
- Publication number 20140264015
- Publication date Sep 18, 2014
- International Business Machines Corporation
- Bing Sun
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT OF WAFERS FOR 3D INTEGRATION
- Publication number 20110215442
- Publication date Sep 8, 2011
- International Business Machines Corporation
- Dmitriy Shneyder
- G06 - COMPUTING CALCULATING COUNTING