Srinivasulu ALAMPALLY

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Bangalore, IN

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Patents Grantslast 30 patents

Information Patent Grant
Scan-based MCM interconnect testing
- Patent number 9,797,948
- Issue date Oct 24, 2017
- Texas Instruments Incorporated
- Milan Shetty
- G01 - MEASURING TESTING
Information Patent Grant
Scan-based MCM interconnecting testing
- Patent number 9,140,754
- Issue date Sep 22, 2015
- Texas Instruments Incorporated
- Milan Shetty
- G01 - MEASURING TESTING
Information Patent Grant
On-chip seed generation using boolean functions for LFSR re-seeding...
- Patent number 8,286,042
- Issue date Oct 9, 2012
- Texas Instruments Incorporated
- Swathi Gangasani
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCAN-BASED MCM INTERCONNECT TESTING
- Publication number 20150355278
- Publication date Dec 10, 2015
- TEXAS INSTRUMENTS INCORPORATED
- Milan Shetty
- G01 - MEASURING TESTING
Information Patent Application
SCAN-BASED MCM INTERCONNECTING TESTING
- Publication number 20120221906
- Publication date Aug 30, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Milan SHETTY
- G01 - MEASURING TESTING
Information Patent Application
On-Chip Seed Generation Using Boolean Functions for LFSR Re-Seeding...
- Publication number 20100218059
- Publication date Aug 26, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Swathi Gangasani
- G01 - MEASURING TESTING