Sriram ANANDAKUMAR

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Cycle deterministic functional testing of a chip with asynchronous...
- Patent number 10,073,139
- Issue date Sep 11, 2018
- Oracle International Corporation
- Ali Vahidsafa
- G01 - MEASURING TESTING
Information Patent Grant
Testing of SRAMS
- Patent number 8,726,114
- Issue date May 13, 2014
- Oracle International Corporation
- Ali Vahidsafa
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self-test of 3-dimensional semiconductor memory arrays
- Patent number 7,797,594
- Issue date Sep 14, 2010
- Oracle America, Inc.
- Ishwardutt Parulkar
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CYCLE DETERMINISTIC FUNCTIONAL TESTING OF A CHIP WITH ASYNCHRONOUS...
- Publication number 20160091565
- Publication date Mar 31, 2016
- Oracle International Corporation
- Ali Vahidsafa
- G01 - MEASURING TESTING
Information Patent Application
TESTING OF SRAMS
- Publication number 20140136909
- Publication date May 15, 2014
- ORACLE INTERNATIONAL CORPORATION
- Ali VAHIDSAFA
- G11 - INFORMATION STORAGE