Sriram MADHAVAN

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Feed-forward for silicon inspections (DFM2CFM : design to silicon)...
- Patent number 10,095,826
- Issue date Oct 9, 2018
- GLOBALFOUNDRIES Inc.
- Shikha Somani
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, system and program product for identifying anomalies in int...
- Patent number 10,055,535
- Issue date Aug 21, 2018
- GLOBALFOUNDRIES Inc.
- Piyush Pathak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Stitch insertion for reducing color density differences in double p...
- Patent number 8,918,745
- Issue date Dec 23, 2014
- GLOBALFOUNDRIES Inc.
- Lynn Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for applying post graphic data system stream e...
- Patent number 8,745,553
- Issue date Jun 3, 2014
- GLOBALFOUNDRIES Inc.
- Swamy Muddu
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Pattern based method for identifying design for manufacturing impro...
- Patent number 8,656,336
- Issue date Feb 18, 2014
- GLOBALFOUNDRIES Inc.
- Piyush Pathak
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Methods for quantitatively evaluating the quality of double pattern...
- Patent number 8,516,407
- Issue date Aug 20, 2013
- GLOBALFOUNDRIES, INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Body tie test structure for accurate body effect measurement
- Patent number 8,293,606
- Issue date Oct 23, 2012
- GLOBALFOUNDARIES, Inc.
- Sriram Madhavan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Body tie test structure for accurate body effect measurement
- Patent number 7,880,229
- Issue date Feb 1, 2011
- GLOBALFOUNDRIES Inc.
- Sriram Madhavan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device for determining charge damage to a transistor
- Patent number 7,804,317
- Issue date Sep 28, 2010
- Advanced Micro Devices, Inc.
- Biju Parameshwaran
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD, SYSTEM AND PROGRAM PRODUCT FOR IDENTIFYING ANOMALIES IN INT...
- Publication number 20180089357
- Publication date Mar 29, 2018
- GLOBALFOUNDRIES INC.
- Piyush PATHAK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FEED-FORWARD FOR SILICON INSPECTIONS (DFM2CFM : DESIGN TO SILICON)...
- Publication number 20170364626
- Publication date Dec 21, 2017
- GLOBALFOUNDRIES INC.
- Shikha SOMANI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING FOR PREDICTING DEFECT LIMITED YIELD
- Publication number 20150286763
- Publication date Oct 8, 2015
- GLOBALFOUNDRIES INC.
- Lynn WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STITCH INSERTION FOR REDUCING COLOR DENSITY DIFFERENCES IN DOUBLE P...
- Publication number 20140282301
- Publication date Sep 18, 2014
- GLOBALFOUNDRIES INC.
- Lynn WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR APPLYING POST GRAPHIC DATA SYSTEM STREAM E...
- Publication number 20140059506
- Publication date Feb 27, 2014
- GLOBALFOUNDRIES INC.
- Swamy MUDDU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN BASED METHOD FOR IDENTIFYING DESIGN FOR MANUFACTURING IMPRO...
- Publication number 20130227498
- Publication date Aug 29, 2013
- GLOBALFOUNDRIES INC.
- Piyush Pathak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR QUANTITATIVELY EVALUATING THE QUALITY OF DOUBLE PATTERN...
- Publication number 20130198696
- Publication date Aug 1, 2013
- GLOBALFOUNDRIES INC.
- Lynn T. Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT
- Publication number 20110086484
- Publication date Apr 14, 2011
- GLOBALFOUNDRIES INC.
- Sriram MADHAVAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT
- Publication number 20090101976
- Publication date Apr 23, 2009
- Advanced Micro Devices, Inc.
- Sriram MADHAVAN
- H01 - BASIC ELECTRIC ELEMENTS

Sriram MADHAVAN

Person

Patents Grantslast 30 patents

Feed-forward for silicon inspections (DFM2CFM : design to silicon)...

Method, system and program product for identifying anomalies in int...

Stitch insertion for reducing color density differences in double p...

Method and apparatus for applying post graphic data system stream e...

Pattern based method for identifying design for manufacturing impro...

Methods for quantitatively evaluating the quality of double pattern...

Body tie test structure for accurate body effect measurement

Body tie test structure for accurate body effect measurement

Test device for determining charge damage to a transistor

Patents Applicationslast 30 patents

METHOD, SYSTEM AND PROGRAM PRODUCT FOR IDENTIFYING ANOMALIES IN INT...

FEED-FORWARD FOR SILICON INSPECTIONS (DFM2CFM : DESIGN TO SILICON)...

PATTERN MATCHING FOR PREDICTING DEFECT LIMITED YIELD

STITCH INSERTION FOR REDUCING COLOR DENSITY DIFFERENCES IN DOUBLE P...

METHOD AND APPARATUS FOR APPLYING POST GRAPHIC DATA SYSTEM STREAM E...

PATTERN BASED METHOD FOR IDENTIFYING DESIGN FOR MANUFACTURING IMPRO...

METHODS FOR QUANTITATIVELY EVALUATING THE QUALITY OF DOUBLE PATTERN...

BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT

BODY TIE TEST STRUCTURE FOR ACCURATE BODY EFFECT MEASUREMENT