Sriram Mandyam Krishnakumar

Follow

Person

Bengaluru, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Test and measurement system for parallel waveform analysis
- Patent number 11,442,102
- Issue date Sep 13, 2022
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN TEST AND MEASUREMEN...
- Publication number 20230086626
- Publication date Mar 23, 2023
- Tektronix, Inc.
- Siby Charley Pulikottil
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT SYSTEM FOR PARALLEL WAVEFORM ANALYSIS
- Publication number 20200363471
- Publication date Nov 19, 2020
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING