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Srivaths Ravi
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Bangalore, IN
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Patents Grants
last 30 patents
Information
Patent Grant
Testing of integrated circuits during at-speed mode of operation
Patent number
11,333,707
Issue date
May 17, 2022
Texas Instruments Incorporated
Khushboo Agarwal
G01 - MEASURING TESTING
Information
Patent Grant
Scan compression architecture with bypassable scan chains for low t...
Patent number
8,856,601
Issue date
Oct 7, 2014
Texas Instruments Incorporated
Srivaths Ravi
G01 - MEASURING TESTING
Information
Patent Grant
Circuits and methods for dynamic allocation of scan test resources
Patent number
8,839,063
Issue date
Sep 16, 2014
Texas Instruments Incorporated
Rubin Ajit Parekhji
G01 - MEASURING TESTING
Information
Patent Grant
Low overhead and timing improved architecture for performing error...
Patent number
8,671,329
Issue date
Mar 11, 2014
Texas Instruments Incorporated
Sanjay Kumar
G11 - INFORMATION STORAGE
Information
Patent Grant
Hybrid test compression architecture using multiple codecs for low...
Patent number
8,527,821
Issue date
Sep 3, 2013
Texas Instruments Incorporated
Malav Shrikant Shah
G01 - MEASURING TESTING
Information
Patent Grant
Low overhead and timing improved architecture for performing error...
Patent number
8,438,344
Issue date
May 7, 2013
Texas Instruments Incorporated
Sanjay Kumar
G11 - INFORMATION STORAGE
Information
Patent Grant
On-chip seed generation using boolean functions for LFSR re-seeding...
Patent number
8,286,042
Issue date
Oct 9, 2012
Texas Instruments Incorporated
Swathi Gangasani
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced control in scan tests of integrated circuits with partitio...
Patent number
8,205,125
Issue date
Jun 19, 2012
Texas Instruments Incorporated
Alan David Hales
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION
Publication number
20200132763
Publication date
Apr 30, 2020
TEXAS INSTRUMENTS INCORPORATED
Khushboo Agarwal
G01 - MEASURING TESTING
Information
Patent Application
TESTING OF INTEGRATED CIRCUITS DURING AT-SPEED MODE OF OPERATION
Publication number
20150212152
Publication date
Jul 30, 2015
TEXAS INSTRUMENTS INCORPORATED
Khushboo Agarwal
G01 - MEASURING TESTING
Information
Patent Application
CIRCUITS AND METHODS FOR DYNAMIC ALLOCATION OF SCAN TEST RESOURCES
Publication number
20140208177
Publication date
Jul 24, 2014
TEXAS INSTRUMENTS INCORPORATED
Rubin Ajit Parekhji
G01 - MEASURING TESTING
Information
Patent Application
LOW OVERHEAD AND TIMING IMPROVED ARCHITECTURE FOR PERFORMING ERROR...
Publication number
20130246889
Publication date
Sep 19, 2013
TEXAS INSTRUMENTS INCORPORATED
Sanjay Kumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan Compression Architecture with Bypassable Scan Chains for Low T...
Publication number
20130159800
Publication date
Jun 20, 2013
TEXAS INSTRUMENTS INCORPORATED
Srivaths Ravi
G01 - MEASURING TESTING
Information
Patent Application
HYBRID TEST COMPRESSION ARCHITECTURE USING MULTIPLE CODECS FOR LOW...
Publication number
20120304031
Publication date
Nov 29, 2012
TEXAS INSTRUMENTS INCORPORATED
Malav Shrikant Shah
G01 - MEASURING TESTING
Information
Patent Application
LOW OVERHEAD AND TIMING IMPROVED ARCHITECTURE FOR PERFORMING ERROR...
Publication number
20110225475
Publication date
Sep 15, 2011
TEXAS INSTRUMENTS INCORPORATED
Sanjay Kumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIO...
Publication number
20110099442
Publication date
Apr 28, 2011
TEXAS INSTRUMENTS INCORPORATED
Alan David Hales
G01 - MEASURING TESTING
Information
Patent Application
On-Chip Seed Generation Using Boolean Functions for LFSR Re-Seeding...
Publication number
20100218059
Publication date
Aug 26, 2010
TEXAS INSTRUMENTS INCORPORATED
Swathi Gangasani
G01 - MEASURING TESTING