Srivatsa G. Kundalgurki

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting change in species in an environment
- Patent number 9,897,564
- Issue date Feb 20, 2018
- NXP USA, INC.
- Srivatsa G. Kundalgurki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etch release residue removal using anhydrous solution
- Patent number 9,663,356
- Issue date May 30, 2017
- NXP USA, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Systems and methods for detecting change in species in an environment
- Patent number 9,658,180
- Issue date May 23, 2017
- NXP USA, INC.
- Srivatsa G. Kundalgurki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for detecting change in species in an environment
- Patent number 9,658,199
- Issue date May 23, 2017
- NXP USA, INC.
- Srivatsa G. Kundalgurki
- G01 - MEASURING TESTING
Information Patent Grant
PIN diode with nanoclusters
- Patent number 9,583,665
- Issue date Feb 28, 2017
- NXP USA, INC.
- Srivatsa G. Kundalgurki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching trenches in a substrate
- Patent number 8,993,451
- Issue date Mar 31, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method for etched cavity devices
- Patent number 8,709,848
- Issue date Apr 29, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT
- Publication number 20170045467
- Publication date Feb 16, 2017
- FREESCALE SEMICONDUCTOR, INC.
- SRIVATSA G. KUNDALGURKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT
- Publication number 20160238551
- Publication date Aug 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- SRIVATSA G. KUNDALGURKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT
- Publication number 20160238580
- Publication date Aug 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- SRIVATSA G. KUNDALGURKI
- G01 - MEASURING TESTING
Information Patent Application
PIN DIODE WITH NANOCLUSTERS
- Publication number 20160071997
- Publication date Mar 10, 2016
- SRIVATSA G. KUNDALGURKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCH RELEASE RESIDUE REMOVAL USING ANHYDROUS SOLUTION
- Publication number 20150368099
- Publication date Dec 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PHOTRONIC DEVICE WITH REFLECTOR AND METHOD FOR FORMING
- Publication number 20130313668
- Publication date Nov 28, 2013
- Gregory S. Spencer
- G02 - OPTICS
Information Patent Application
ETCHING TRENCHES IN A SUBSTRATE
- Publication number 20120264307
- Publication date Oct 18, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHOD FOR ETCHED CAVITY DEVICES
- Publication number 20120264249
- Publication date Oct 18, 2012
- FREESCALE SEMICONDUCTOR, INC.
- Srivatsa G. Kundalgurki
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Srivatsa G. Kundalgurki

Person

Patents Grantslast 30 patents

Systems and methods for detecting change in species in an environment

Etch release residue removal using anhydrous solution

Systems and methods for detecting change in species in an environment

Systems and methods for detecting change in species in an environment

PIN diode with nanoclusters

Etching trenches in a substrate

Method for etched cavity devices

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT

SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT

SYSTEMS AND METHODS FOR DETECTING CHANGE IN SPECIES IN AN ENVIRONMENT

PIN DIODE WITH NANOCLUSTERS

ETCH RELEASE RESIDUE REMOVAL USING ANHYDROUS SOLUTION

PHOTRONIC DEVICE WITH REFLECTOR AND METHOD FOR FORMING

ETCHING TRENCHES IN A SUBSTRATE

METHOD FOR ETCHED CAVITY DEVICES