Srujan Kumar Nakidi

Follow

Person

Adilabad, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Enhanced control in scan tests of integrated circuits with partitio...
- Patent number 8,205,125
- Issue date Jun 19, 2012
- Texas Instruments Incorporated
- Alan David Hales
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ENHANCED CONTROL IN SCAN TESTS OF INTEGRATED CIRCUITS WITH PARTITIO...
- Publication number 20110099442
- Publication date Apr 28, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Alan David Hales
- G01 - MEASURING TESTING