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Stacey Stone
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Brno, CZ
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Patents Grants
last 30 patents
Information
Patent Grant
Automated TEM sample preparation
Patent number
10,825,651
Issue date
Nov 3, 2020
FEI Company
Valerie Brogden
G01 - MEASURING TESTING
Information
Patent Grant
Automated TEM sample preparation
Patent number
10,340,119
Issue date
Jul 2, 2019
FEI Company
Valerie Brogden
G01 - MEASURING TESTING
Information
Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
Patent number
10,026,590
Issue date
Jul 17, 2018
FEI Company
Stacey Stone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated TEM sample preparation
Patent number
9,601,313
Issue date
Mar 21, 2017
FEI Company
Valerie Brogden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Depositing material into high aspect ratio structures
Patent number
9,384,982
Issue date
Jul 5, 2016
FEI Company
Sang Hoon Lee
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Method for preparing thin samples for TEM imaging
Patent number
9,279,752
Issue date
Mar 8, 2016
FEI Company
Michael Moriarty
G01 - MEASURING TESTING
Information
Patent Grant
Method for preparing samples for imaging
Patent number
8,912,490
Issue date
Dec 16, 2014
FEI Company
Ronald Kelley
B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATED TEM SAMPLE PREPARATION
Publication number
20190272975
Publication date
Sep 5, 2019
FEI Company
Valerie Brogden
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED TEM SAMPLE PREPARATION
Publication number
20170256380
Publication date
Sep 7, 2017
FEI Company
Valerie Brogden
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED TEM SAMPLE PREPARATION
Publication number
20160141147
Publication date
May 19, 2016
FEI Company
Valerie Brogden
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Fiducial Design for Tilted or Glancing Mill Operations with a Charg...
Publication number
20150357159
Publication date
Dec 10, 2015
FEI Company
Stacey Stone
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEPOSITING MATERIAL INTO HIGH ASPECT RATIO STRUCTURES
Publication number
20150340235
Publication date
Nov 26, 2015
FEI Company
Sang Hoon Lee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
Publication number
20150330877
Publication date
Nov 19, 2015
FEI Company
Michael Schmidt
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PREPARING THIN SAMPLES FOR TEM IMAGING
Publication number
20150102009
Publication date
Apr 16, 2015
FEI Company
Michael Moriarty
G01 - MEASURING TESTING