Stacey Stone

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Fiducial design for tilted or glancing mill operations with a charg...
- Patent number 11,315,756
- Issue date Apr 26, 2022
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput TEM preparation processes and hardware for backside...
- Patent number 10,283,317
- Issue date May 7, 2019
- FEI Company
- Paul Keady
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
High aspect ratio structure analysis
- Patent number 9,741,536
- Issue date Aug 22, 2017
- FEI Company
- Sang Hoon Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Multidimensional structural access
- Patent number 9,696,372
- Issue date Jul 4, 2017
- FEI Company
- Jeffrey Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High throughput TEM preparation processes and hardware for backside...
- Patent number 9,653,260
- Issue date May 16, 2017
- FEI Company
- Paul Keady
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and system for reducing curtaining in charged particle beam...
- Patent number 9,488,554
- Issue date Nov 8, 2016
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bulk deposition for tilted mill protection
- Patent number 9,412,560
- Issue date Aug 9, 2016
- FEI Company
- Stacey Stone
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating S/TEM sample and sample structure
- Patent number 9,336,985
- Issue date May 10, 2016
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Protective layer for charged particle beam processing
- Patent number 9,263,306
- Issue date Feb 16, 2016
- FEI Company
- Jeff Blackwood
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing samples for imaging
- Patent number 9,111,720
- Issue date Aug 18, 2015
- FEI Company
- Ronald Kelley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method for creating S/TEM sample and sample structure
- Patent number 9,006,651
- Issue date Apr 14, 2015
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Methods for preparing thin samples for TEM imaging
- Patent number 8,859,963
- Issue date Oct 14, 2014
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Grant
Method for preparing samples for imaging
- Patent number 8,822,921
- Issue date Sep 2, 2014
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Grant
Multiple sample attachment to nano manipulator for high throughput...
- Patent number 8,729,469
- Issue date May 20, 2014
- FEI Company
- Michael Schmidt
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for creating S/TEM sample and sample structure
- Patent number 8,536,525
- Issue date Sep 17, 2013
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating S/TEM sample and sample structure
- Patent number 8,525,137
- Issue date Sep 3, 2013
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Method for creating S/tem sample and sample structure
- Patent number 8,134,124
- Issue date Mar 13, 2012
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Grant
Protective layer for charged particle beam processing
- Patent number 8,097,308
- Issue date Jan 17, 2012
- FEI Company
- Jeff Blackwood
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARG...
- Publication number 20180301319
- Publication date Oct 18, 2018
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE...
- Publication number 20170250055
- Publication date Aug 31, 2017
- FEI Company
- Paul Keady
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20150323429
- Publication date Nov 12, 2015
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Reducing Curtaining in Charged Particle Beam...
- Publication number 20150276567
- Publication date Oct 1, 2015
- FEI Company
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
Multidimensional Structural Access
- Publication number 20150260784
- Publication date Sep 17, 2015
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
High Aspect Ratio Structure Analysis
- Publication number 20150243478
- Publication date Aug 27, 2015
- FEI Company
- Sang Hoon Lee
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Bulk Deposition for Tilted Mill Protection
- Publication number 20150243477
- Publication date Aug 27, 2015
- FEI Company
- Stacey Stone
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20150179402
- Publication date Jun 25, 2015
- FEI Company
- Ronald Kelley
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR PREPARING SAMPLES FOR IMAGING
- Publication number 20140190934
- Publication date Jul 10, 2014
- Michael Schmidt
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20140116873
- Publication date May 1, 2014
- FEI Company
- Jeffrey Blackwood
- G01 - MEASURING TESTING
Information Patent Application
High Throughput TEM Preparation Processes and Hardware for Backside...
- Publication number 20130248354
- Publication date Sep 26, 2013
- Paul Keady
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PREPARING THIN SAMPLES FOR TEM IMAGING
- Publication number 20130143412
- Publication date Jun 6, 2013
- FEI Company
- Michael Moriarty
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20120152731
- Publication date Jun 21, 2012
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Application
Protective Layer For Charged Particle Beam Processing
- Publication number 20120107521
- Publication date May 3, 2012
- FEI Company
- JEFF BLACKWOOD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20100308219
- Publication date Dec 9, 2010
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE
- Publication number 20100300873
- Publication date Dec 2, 2010
- FEI Company
- Jeff Blackwood
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE LAYER FOR CHARGED PARTICLE BEAM PROCESSING
- Publication number 20080102224
- Publication date May 1, 2008
- FEI Company
- JEFF BLACKWOOD
- H01 - BASIC ELECTRIC ELEMENTS

Stacey Stone

Person

Patents Grantslast 30 patents

Fiducial design for tilted or glancing mill operations with a charg...

High throughput TEM preparation processes and hardware for backside...

High aspect ratio structure analysis

Multidimensional structural access

High throughput TEM preparation processes and hardware for backside...

Method and system for reducing curtaining in charged particle beam...

Bulk deposition for tilted mill protection

Method for creating S/TEM sample and sample structure

Protective layer for charged particle beam processing

Method for preparing samples for imaging

Method for creating S/TEM sample and sample structure

Methods for preparing thin samples for TEM imaging

Method for preparing samples for imaging

Multiple sample attachment to nano manipulator for high throughput...

Method for creating S/TEM sample and sample structure

Method for creating S/TEM sample and sample structure

Method for creating S/tem sample and sample structure

Protective layer for charged particle beam processing

Patents Applicationslast 30 patents

FIDUCIAL DESIGN FOR TILTED OR GLANCING MILL OPERATIONS WITH A CHARG...

HIGH THROUGHPUT TEM PREPARATION PROCESSES AND HARDWARE FOR BACKSIDE...

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

Method and System for Reducing Curtaining in Charged Particle Beam...

Multidimensional Structural Access

High Aspect Ratio Structure Analysis

Bulk Deposition for Tilted Mill Protection

METHOD FOR PREPARING SAMPLES FOR IMAGING

METHOD FOR PREPARING SAMPLES FOR IMAGING

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

High Throughput TEM Preparation Processes and Hardware for Backside...

METHODS FOR PREPARING THIN SAMPLES FOR TEM IMAGING

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

Protective Layer For Charged Particle Beam Processing

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

METHOD FOR CREATING S/TEM SAMPLE AND SAMPLE STRUCTURE

PROTECTIVE LAYER FOR CHARGED PARTICLE BEAM PROCESSING