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Stacy Firth
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Austin, TX, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for estimating error in a manufacturing process
Patent number
6,718,224
Issue date
Apr 6, 2004
Yield Dynamics, Inc.
Stacy Firth
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Grant
System and method for controlling critical dimension in a semicondu...
Patent number
6,643,596
Issue date
Nov 4, 2003
Yield Dynamics, Inc.
Stacy K. Firth
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
System and method for controlling critical dimension in a semicondu...
Publication number
20030115005
Publication date
Jun 19, 2003
Stacy K. Firth
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
System and method for estimating error in a manufacturing process
Publication number
20030055524
Publication date
Mar 20, 2003
Stacy Firth
G05 - CONTROLLING REGULATING