Stanislaw Marek Borowicz

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Sharp scattering angle trap for electron beam apparatus
- Patent number 8,890,066
- Issue date Nov 18, 2014
- KLA-Tencor Corporation
- Yehiel Gotkis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for e-beam dark imaging with perspective control
- Patent number 7,838,833
- Issue date Nov 23, 2010
- KLA-Tencor Technologies Corporation
- Matthew Lent
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional imaging using electron beam activated chemical etch
- Patent number 7,709,792
- Issue date May 4, 2010
- KLA-Tencor Technologies Corporation
- Mehran Naser-Ghodsi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
THREE-DIMENSIONAL IMAGING USING ELECTRON BEAM ACTIVATED CHEMICAL ETCH
- Publication number 20070158562
- Publication date Jul 12, 2007
- KLA-Tencor Technologies Corporation
- MEHRAN NASSER-GHODSI
- H01 - BASIC ELECTRIC ELEMENTS