Stanislaw Piorek

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Hillsborough, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Compact two-dimensional spectrometer
- Patent number 11,009,397
- Issue date May 18, 2021
- Rigaku Analytical Devices, Inc.
- David Steven Mercuro
- G01 - MEASURING TESTING
Information Patent Grant
Device for analyzing the material composition of an object via plas...
- Patent number 10,732,117
- Issue date Aug 4, 2020
- Rigaku Analytical Devices, Inc.
- Michael Anthony Damento
- G01 - MEASURING TESTING
Information Patent Grant
Device for analyzing the material composition of a sample via plasm...
- Patent number 10,234,396
- Issue date Mar 19, 2019
- RIGAKU RAMAN TECHNOLOGIES, INC.
- Scott Charles Buchter
- G02 - OPTICS
Information Patent Grant
Sample analysis
- Patent number 8,982,338
- Issue date Mar 17, 2015
- Thermo Scientific Portable Analytical Instruments Inc.
- Mark A. Hamilton
- G01 - MEASURING TESTING
Information Patent Grant
Metal authenticity testing of an object using radiation
- Patent number 8,515,009
- Issue date Aug 20, 2013
- Thermo NITON Analyzers LLC
- Stanislaw Piorek
- G01 - MEASURING TESTING
Information Patent Grant
Small spot X-ray fluorescence (XRF) analyzer
- Patent number 7,916,834
- Issue date Mar 29, 2011
- Thermo NITON Analyzers LLC
- Stanislaw Piorek
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COMPACT TWO-DIMENSIONAL SPECTROMETER
- Publication number 20200124476
- Publication date Apr 23, 2020
- Rigaku Analytical Devices, Inc.
- David Steven Mercuro
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR ANALYZING THE MATERIAL COMPOSITION OF AN OBJECT VIA PLAS...
- Publication number 20200124536
- Publication date Apr 23, 2020
- Rigaku Analytical Devices, Inc.
- Michael Anthony Damento
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS
- Publication number 20130321793
- Publication date Dec 5, 2013
- Mark A. HAMILTON
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFICATION OF COUNTERFEIT GOLD JEWELRY US...
- Publication number 20130202083
- Publication date Aug 8, 2013
- Stanislaw Piorek
- G01 - MEASURING TESTING
Information Patent Application
METAL AUTHENTICITY TESTING OF AN OBJECT USING RADIATION
- Publication number 20130202084
- Publication date Aug 8, 2013
- THERMO NITON ANALYZERS LLC
- Stanislaw Piorek
- G01 - MEASURING TESTING
Information Patent Application
Small Spot X-Ray Fluorescence (XRF) Analyzer
- Publication number 20110142200
- Publication date Jun 16, 2011
- Stanislaw Piorek
- G01 - MEASURING TESTING
Information Patent Application
SMALL SPOT X-RAY FLUORESCENCE (XRF) ANALYZER
- Publication number 20080192897
- Publication date Aug 14, 2008
- Stanislaw Piorek
- G01 - MEASURING TESTING