Stanley B. Smith Jr.

Person

  • Westford, MA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Spectroanalytical systems

    • Patent number 5,088,823
    • Issue date Feb 18, 1992
    • Thermo Jarrell Ash Corporation
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sample analysis apparatus

    • Patent number 4,804,519
    • Issue date Feb 14, 1989
    • Thermo Jarrell Ash Corporation
    • Mario A. Sainz
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroanalysis system

    • Patent number 4,545,680
    • Issue date Oct 8, 1985
    • Allied Corporation
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of emission spectroanalysis

    • Patent number 4,531,836
    • Issue date Jul 30, 1985
    • Allied Corporation
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroanalytical system

    • Patent number 4,462,685
    • Issue date Jul 31, 1984
    • Instrumentation Laboratory Inc.
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Spectroanalytical system

    • Patent number 4,367,042
    • Issue date Jan 4, 1983
    • Instrumentation Laboratory Inc.
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic sample deposition in flameless analysis

    • Patent number 4,361,401
    • Issue date Nov 30, 1982
    • Instrumentation Laboratory Inc.
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Keyboard type of input control system for an analytical instrument

    • Patent number 4,330,776
    • Issue date May 18, 1982
    • Instrumentation Laboratory Inc.
    • Allan G. Dennison
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Dual monochromator type of spectroanalysis system

    • Patent number 4,326,802
    • Issue date Apr 27, 1982
    • Instrumentation Laboratory Inc.
    • Stanley B. Smith
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Induction plasma system

    • Patent number 4,306,175
    • Issue date Dec 15, 1981
    • Instrumentation Laboratory Inc.
    • Robert G. Schleicher
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR