Stanley E. Jaffe

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Santa Rosa, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Graphical presentation of spectral information for aid in complianc...
- Patent number 7,019,746
- Issue date Mar 28, 2006
- Agilent Technologies, Inc.
- Karl Shubert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Rapid graphical analysis of waveforms using a pointing device
- Patent number 7,013,430
- Issue date Mar 14, 2006
- Agilent Technologies, Inc.
- Stanley Edward Jaffe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced signal analysis in an amplitude versus frequency format
- Patent number 6,687,628
- Issue date Feb 3, 2004
- Agilent Technologies, Inc.
- Stanley Edward Jaffe
- G01 - MEASURING TESTING
Information Patent Grant
Method for automatically scaling sampled representations of single-...
- Patent number 6,356,849
- Issue date Mar 12, 2002
- Agilent Technologies, Inc.
- Stanley E. Jaffe
- G01 - MEASURING TESTING
Information Patent Grant
Method for controlling scale parameters of an instrument in respons...
- Patent number 6,278,268
- Issue date Aug 21, 2001
- Agilent Technologies, Inc.
- Stanley E. Jaffe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for displaying markers and rendered waveforms
- Publication number 20040017384
- Publication date Jan 29, 2004
- Stanley E. Jaffe
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Rapid graphical analysis of waveforms using a pointing device
- Publication number 20030142142
- Publication date Jul 31, 2003
- Stanley Edward Jaffe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Graphical presentation of spectral information for aid in complianc...
- Publication number 20030085897
- Publication date May 8, 2003
- Karl Shubert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Enhanced signal analysis in an amplitude versus frequency format
- Publication number 20020120414
- Publication date Aug 29, 2002
- Stanley Edward Jaffe
- G01 - MEASURING TESTING