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Stanley G. Burns
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Ames, IA, US
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last 30 patents
Information
Patent Grant
Method of making amorphous silicon on insulator VLSI circuit struct...
Patent number
6,017,794
Issue date
Jan 25, 2000
Iowa State University Research Foundation
Stanley G. Burns
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Dielectric for amorphous silicon transistors
Patent number
5,856,690
Issue date
Jan 5, 1999
Iowa State University Research Foundation
Stanley G. Burns
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flexible panel display having thin film transistors driving polymer...
Patent number
5,821,688
Issue date
Oct 13, 1998
Iowa State University Research Foundation
Howard R. Shanks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flexible panel display having thin film transistors driving polymer...
Patent number
5,747,928
Issue date
May 5, 1998
Iowa State University Research Foundation, Inc.
Howard R. Shanks
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Amorphous silicon on insulator VLSI circuit structures
Patent number
5,742,075
Issue date
Apr 21, 1998
Iowa State University Research Foundation, Inc.
Stanley G. Burns
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Non-crystalline silicon active device for large-scale digital and a...
Patent number
5,440,150
Issue date
Aug 8, 1995
Iowa State University Research Foundation, Inc.
Stanley G. Burns
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
High frequency oscillator comprising cointegrated thin film resonat...
Patent number
5,075,641
Issue date
Dec 24, 1991
Iowa State University Research Foundation, Inc.
Robert J. Weber
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electronically-tuned thin-film resonator/filter controlled oscillator
Patent number
4,988,957
Issue date
Jan 29, 1991
Iowa State University Research Foundation, Inc.
Philip H. Thompson
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Moisture measurement apparatus and method
Patent number
4,616,425
Issue date
Oct 14, 1986
Iowa State University Research Foundation
Stanley G. Burns
G01 - MEASURING TESTING