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Stefaan Kerckenaere
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Eernegem, BE
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Patents Grants
last 30 patents
Information
Patent Grant
Device for monitoring quiescent current of an electronic device
Patent number
7,315,180
Issue date
Jan 1, 2008
Q-Star Test N.V.
Hans Manhaeve
G01 - MEASURING TESTING
Information
Patent Grant
Device for monitoring quiescent current of an electronic device
Patent number
6,927,592
Issue date
Aug 9, 2005
Q-Star Test N.V.
Hans Manhaeve
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing supply connections
Patent number
6,531,885
Issue date
Mar 11, 2003
Interuniversitair Micro-Elektronica Centrum (IMEC vzw)
Hans Manhaeve
G01 - MEASURING TESTING
Information
Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
Patent number
6,441,633
Issue date
Aug 27, 2002
Interuniversitair Micro-Elektronica Centrum
Hans Manhaeve
G01 - MEASURING TESTING
Information
Patent Grant
High resolution (quiescent) supply current system (IDD monitor)
Patent number
6,118,293
Issue date
Sep 12, 2000
Hans Manhaeve
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Device for monitoring quiescent current of an electronic device
Publication number
20050156619
Publication date
Jul 21, 2005
Q-Star Test N.V.
Hans Manhaeve
G01 - MEASURING TESTING
Information
Patent Application
Device for monitoring quiescent current of an electronic device
Publication number
20040046576
Publication date
Mar 11, 2004
Q-Star Test N.V.
Hans Manhaeve
G01 - MEASURING TESTING