Stefan Florek

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Berlin, DD

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Patents Grantslast 30 patents

Information Patent Grant
Device for the investigation of highly resolved partial spectra of...
- Patent number 4,940,325
- Issue date Jul 10, 1990
- Akademie der Wissenschaften der DDR
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable echelle spectrometer arrangement and method for its adju...
- Patent number 4,856,898
- Issue date Aug 15, 1989
- Jenoptik Jena G.m.b.H.
- Helmut Becker-Ross
- G01 - MEASURING TESTING
Information Patent Grant
Optical system for spectral analysis devices
- Patent number 4,690,559
- Issue date Sep 1, 1987
- Jenoptik Jena G.m.b.H.
- Stefan Florek
- G01 - MEASURING TESTING