Stefan Funk

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Traunstein, DE

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Patents Grantslast 30 patents

Information Patent Grant
Scanning reticle including a grating formed in a substrate for an o...
- Patent number 10,914,615
- Issue date Feb 9, 2021
- Dr. Johannes Heidenhain GmbH
- Stefan Funk
- G01 - MEASURING TESTING
Information Patent Grant
Optical layer system
- Patent number 10,094,961
- Issue date Oct 9, 2018
- Dr. Johannes Heidenhain GmbH
- Peter Speckbacher
- G02 - OPTICS
Information Patent Grant
Scale and position-measuring device having such a scale
- Patent number 10,018,485
- Issue date Jul 10, 2018
- Dr. Johannes Heidenhain GmbH
- Stefan Funk
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING RETICLE FOR AN OPTICAL POSITION MEASURING DEVICE
- Publication number 20190041243
- Publication date Feb 7, 2019
- Dr. Johannes Heidenhain Gmbh
- Stefan FUNK
- G01 - MEASURING TESTING
Information Patent Application
SCALE AND POSITION-MEASURING DEVICE HAVING SUCH A SCALE
- Publication number 20170211951
- Publication date Jul 27, 2017
- Dr. Johannes Heidenhain Gmbh
- Stefan Funk
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL LAYER SYSTEM
- Publication number 20170090079
- Publication date Mar 30, 2017
- Dr. Johannes Heidenhain Gmbh
- Peter Speckbacher
- G02 - OPTICS