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Stefan Heist
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Jena, DE
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Patents Grants
last 30 patents
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Patent Grant
Device and method for spatially measuring surfaces
Patent number
10,378,888
Issue date
Aug 13, 2019
Friedrich-Schiller-Universitaet Jena
Stefan Heist
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for the contact-free measurement of surface contours
Patent number
10,302,421
Issue date
May 28, 2019
Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
Stefan Heist
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND APPARATUS FOR CONTACTLESS MEASURING OF AN OBJECT SURFACE
Publication number
20230071288
Publication date
Mar 9, 2023
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Martin Landmann
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR SPATIALLY MEASURING SURFACES
Publication number
20180149472
Publication date
May 31, 2018
Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
Stefan Heist
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR THE CONTACT-FREE MEASUREMENT OF SURFACE CONTOURS
Publication number
20160202051
Publication date
Jul 14, 2016
Fraunhofer-Gesellschaft zur Foerderung de angewandten Forschung e.V.
Stefan Heist
G01 - MEASURING TESTING