Stefan Kredler

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Heuweiler, DE

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor component
- Patent number 8,125,070
- Issue date Feb 28, 2012
- Micronas GmbH
- Stefan Kredler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for testing a hall magnetic field sensor on a...
- Patent number 7,492,178
- Issue date Feb 17, 2009
- Micronas GmbH
- Reiner Bidenbach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor Component
- Publication number 20090152548
- Publication date Jun 18, 2009
- Micronas GmbH
- Stefan Kredler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for testing a hall magnetic field sensor on a wafer
- Publication number 20060284612
- Publication date Dec 21, 2006
- Reiner Bidenbach
- G01 - MEASURING TESTING