Stefan Kurz

Person

Rosenheim, DE

People

Patents Grantslast 30 patents

Information Patent Grant
System for post-processsing of electronic components
- Patent number 9,255,965
- Issue date Feb 9, 2016
- Multitest Elektronische Systeme GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for removing tested semiconductor components
- Patent number 9,014,841
- Issue date Apr 21, 2015
- Multitest Elektronishche Systeme GmbH
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Grant
System for post-processing of electronic components
- Patent number 8,717,048
- Issue date May 6, 2014
- Multitest Elektronische Systems GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Grant
Closure mechanism for pressure test chambers for testing electronic...
- Patent number 8,449,002
- Issue date May 28, 2013
- Multitest Elektronische Systeme GmbH
- Andreas Nagy
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Test apparatus for the testing of electronic components
- Patent number 7,741,861
- Issue date Jun 22, 2010
- Multitest Elektronische Systeme GmbH
- Maximilian Schaule
- G01 - MEASURING TESTING
Information Patent Grant
Device for testing electronic components, in particular ICs, having...
- Patent number 7,633,304
- Issue date Dec 15, 2009
- Multitest Elektronische Systeme GmbH
- Max Schaule
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS
- Publication number 20140167798
- Publication date Jun 19, 2014
- Multitest elektronische Systeme GmbH
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR REMOVING TESTED SEMICONDUCTOR COMPONENTS
- Publication number 20130338818
- Publication date Dec 19, 2013
- Thomas Hofmann
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS
- Publication number 20110043231
- Publication date Feb 24, 2011
- Reinhart Richter
- G01 - MEASURING TESTING
Information Patent Application
CLOSURE MECHANISM FOR PRESSURE TEST CHAMBERS FOR TESTING ELECTRONIC...
- Publication number 20100193520
- Publication date Aug 5, 2010
- Multitest elektronische Systeme GmbH
- Andreas Nagy
- G01 - MEASURING TESTING
Information Patent Application
Method and device for tempering electronic components
- Publication number 20100108205
- Publication date May 6, 2010
- Maximilian Schaule
- G05 - CONTROLLING REGULATING
Information Patent Application
DEVICE FOR TESTING ELECTRONIC COMPONENTS, IN PARTICULAR ICS, HAVING...
- Publication number 20090015277
- Publication date Jan 15, 2009
- Max Schaule
- G01 - MEASURING TESTING
Information Patent Application
Test Apparatus for the Testing of Electronic Components
- Publication number 20080231296
- Publication date Sep 25, 2008
- Multitest elektronische Systeme GmbH
- Maximilian Schaule
- G01 - MEASURING TESTING

Stefan Kurz

Person

Patents Grantslast 30 patents

System for post-processsing of electronic components

Device and method for removing tested semiconductor components

System for post-processing of electronic components

Closure mechanism for pressure test chambers for testing electronic...

Test apparatus for the testing of electronic components

Device for testing electronic components, in particular ICs, having...

Patents Applicationslast 30 patents

SYSTEM FOR POST-PROCESSSING OF ELECTRONIC COMPONENTS

DEVICE AND METHOD FOR REMOVING TESTED SEMICONDUCTOR COMPONENTS

SYSTEM FOR POST-PROCESSING OF ELECTRONIC COMPONENTS

CLOSURE MECHANISM FOR PRESSURE TEST CHAMBERS FOR TESTING ELECTRONIC...

Method and device for tempering electronic components

DEVICE FOR TESTING ELECTRONIC COMPONENTS, IN PARTICULAR ICS, HAVING...

Test Apparatus for the Testing of Electronic Components