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Stefan M.B. Baumer
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Valkenswaard, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Methods of aligning a diffractive optical system and diffracting be...
Patent number
10,983,361
Issue date
Apr 20, 2021
ASML Netherlands B.V.
Sander Bas Roobol
G02 - OPTICS
Information
Patent Grant
Patterning device
Patent number
10,732,498
Issue date
Aug 4, 2020
ASML Netherlands B.V.
Pieter Cristiaan De Groot
G02 - OPTICS
Information
Patent Grant
Optical systems, metrology apparatus and associated method
Patent number
10,725,381
Issue date
Jul 28, 2020
ASML Netherlands B.V.
Sietse Thijmen Van Der Post
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Patterning device
Patent number
10,401,723
Issue date
Sep 3, 2019
ASML Netherlands B.V.
Pieter Cristiaan De Groot
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
Patterning Device
Publication number
20190324365
Publication date
Oct 24, 2019
ASML NETHERLANDS B.V.
Pieter Cristiaan DE GROOT
G02 - OPTICS
Information
Patent Application
Patterning Device
Publication number
20190137861
Publication date
May 9, 2019
ASML NETHERLANDS B.V.
Pieter Cristiaan DE GROOT
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Optical Systems, Metrology Apparatus and Associated Method
Publication number
20190072853
Publication date
Mar 7, 2019
ASML NETHERLANDS B.V.
Sietse Thijmen VAN DER POST
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Methods of Aligning a Diffractive Optical System and Diffracting Be...
Publication number
20180239160
Publication date
Aug 23, 2018
ASML NETHERLANDS B.V.
Sander Bas Roobol
G02 - OPTICS
Information
Patent Application
Device and Method for Optical Precision Measurement
Publication number
20070247639
Publication date
Oct 25, 2007
Koninklijke Philips Electronics, N.V.
Willem D.Van Amstel
G01 - MEASURING TESTING