Stefan Meyer

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 11,276,547
- Issue date Mar 15, 2022
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method of operating a particle beam system
- Patent number 11,092,702
- Issue date Aug 17, 2021
- Carl Zeiss Microscopy GmbH
- Jörg Fober
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,861,670
- Issue date Dec 8, 2020
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam microscope
- Patent number 10,615,000
- Issue date Apr 7, 2020
- Carl Zeiss Microscopy GmbH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the-lens detection o...
- Patent number 10,522,321
- Issue date Dec 31, 2019
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus for through-the lens detection o...
- Patent number 10,068,744
- Issue date Sep 4, 2018
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle optical apparatus having a selectively positionabl...
- Patent number 9,741,528
- Issue date Aug 22, 2017
- Carl Zeiss Microscopy GmbH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam microscope
- Patent number 8,476,589
- Issue date Jul 2, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20210050178
- Publication date Feb 18, 2021
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20200135425
- Publication date Apr 30, 2020
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM MICROSCOPE
- Publication number 20190304742
- Publication date Oct 3, 2019
- CARL ZEISS MICROSCOPY GMBH
- Luyang Han
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...
- Publication number 20180342368
- Publication date Nov 29, 2018
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...
- Publication number 20170154752
- Publication date Jun 1, 2017
- CARL ZEISS MICROSCOPY GMBH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...
- Publication number 20150348742
- Publication date Dec 3, 2015
- CARL ZEISS MICROSCOPY GMBH
- Michael Albiez
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Microscope
- Publication number 20120326032
- Publication date Dec 27, 2012
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Particle Beam Microscope
- Publication number 20120326030
- Publication date Dec 27, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING

Stefan Meyer

Person

Patents Grantslast 30 patents

Charged particle optical apparatus for through-the-lens detection o...

Particle beam system and method of operating a particle beam system

Charged particle optical apparatus for through-the-lens detection o...

Electron beam microscope

Charged particle optical apparatus for through-the-lens detection o...

Charged particle optical apparatus for through-the lens detection o...

Charged particle optical apparatus having a selectively positionabl...

Particle beam microscope

Patents Applicationslast 30 patents

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

ELECTRON BEAM MICROSCOPE

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE LENS DETECTION O...

CHARGED PARTICLE OPTICAL APPARATUS HAVING A SELECTIVELY POSITIONABL...

Particle Beam Microscope

Particle Beam Microscope