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Stefan Othmar POULSEN
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Copenhagen N, DK
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Patents Grants
last 30 patents
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Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
Patent number
9,222,900
Issue date
Dec 29, 2015
Danmarks Tekniske Universitet of Anker Engelundsvej
Erik Mejdal Lauridsen
G01 - MEASURING TESTING
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Patent Grant
X-ray diffraction method of mapping grain structures in a crystalli...
Patent number
9,222,901
Issue date
Dec 29, 2015
Danmarks Tekniske Universitet Anker Engelundsvej
Erik Mejdal Lauridsen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
Publication number
20140307854
Publication date
Oct 16, 2014
CARL ZEISS X-RAY MICROSCOPY, INC.
Erik Mejdal LAURIDSEN
G01 - MEASURING TESTING
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Patent Application
X-RAY DIFFRACTION METHOD OF MAPPING GRAIN STRUCTURES IN A CRYSTALLI...
Publication number
20140254763
Publication date
Sep 11, 2014
DANMARKS TEKNISKE UNIVERSITET
Erik Mejdal LAURIDSEN
G01 - MEASURING TESTING