Stefan Ottow

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring and controlling the water conten...
- Patent number 6,996,479
- Issue date Feb 7, 2006
- Infineon Technologies AG
- Stefan Ottow
- G01 - MEASURING TESTING
Information Patent Grant
Reactor configuration and method for producing it
- Patent number 6,887,437
- Issue date May 3, 2005
- Infineon Technologies AG
- Volker Lehmann
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for assessing a silicon dioxide content
- Patent number 6,749,716
- Issue date Jun 15, 2004
- Infineon Technologies AG
- Stefan Ottow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of handling a silicon wafer
- Patent number 6,663,674
- Issue date Dec 16, 2003
- Infineon Technologies SC300 GmbH & Co. KG
- Michael Thomas Tucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Perforated work piece, and method for producing it
- Patent number 6,558,770
- Issue date May 6, 2003
- Infineon Technologies AG
- Volker Lehmann
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring and controlling the water conten...
- Publication number 20030176979
- Publication date Sep 18, 2003
- Stefan Ottow
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for assessing a silicon dioxide content
- Publication number 20030075272
- Publication date Apr 24, 2003
- Stefan Ottow
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor cell for measuring the concentration of a component in a two...
- Publication number 20030056577
- Publication date Mar 27, 2003
- Stefan Ottow
- G01 - MEASURING TESTING
Information Patent Application
Method of handling a silicon wafer
- Publication number 20020173154
- Publication date Nov 21, 2002
- Michael Thomas Tucker
- H01 - BASIC ELECTRIC ELEMENTS