Stefan Schneidewind

Person

Reichenberg, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for increasing the accuracy of the positioning of a first ob...
- Patent number 8,094,925
- Issue date Jan 10, 2012
- Cascade Microtech, Inc.
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing substrates
- Patent number 7,196,507
- Issue date Mar 27, 2007
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and prober for contacting a contact area with a contact tip
- Patent number 7,057,408
- Issue date Jun 6, 2006
- SUSS MicroTec Test Systems (GmbH)
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for testing substrates at low temperatures
- Patent number 7,046,025
- Issue date May 16, 2006
- SUSS MicroTec Testsystems GmbH
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus with loading device
- Patent number 7,038,441
- Issue date May 2, 2006
- SUSS MicroTec Testsystems GmbH
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Grant
Substrate-holding device for testing circuit arrangements on substr...
- Patent number 6,864,676
- Issue date Mar 8, 2005
- SUSS MicroTec Testsystems (GmbH)
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Grant
Tester for pressure sensors
- Patent number 6,688,156
- Issue date Feb 10, 2004
- Karl Suss Dresden GmbH
- Claus Dietrich
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method For Increasing The Accuracy Of The Positioning Of A First Ob...
- Publication number 20080298671
- Publication date Dec 4, 2008
- SUSS MicroTec Testsystems (GmbH)
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Arrangement and method for testing substrates under load
- Publication number 20050083037
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for testing substrates
- Publication number 20050083036
- Publication date Apr 21, 2005
- Stefan Schneidewind
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and prober for contacting a contact area with a contact tip
- Publication number 20050007135
- Publication date Jan 13, 2005
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Method for increasing the accuracy of the positioning of a first ob...
- Publication number 20040208355
- Publication date Oct 21, 2004
- Stefan Schneidewind
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for testing movement-sensitive substrates
- Publication number 20040119492
- Publication date Jun 24, 2004
- Stefan Schneidewind
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Test apparatus with loading device
- Publication number 20040108847
- Publication date Jun 10, 2004
- Karsten Stoll
- G01 - MEASURING TESTING
Information Patent Application
Test apparatus for testing substrates at low temperatures
- Publication number 20040070415
- Publication date Apr 15, 2004
- Stefan Schneidewind
- G01 - MEASURING TESTING
Information Patent Application
Substrate-holding device for testing circuit arrangements on substr...
- Publication number 20020163350
- Publication date Nov 7, 2002
- Jorg Kiesewetter
- G01 - MEASURING TESTING
Information Patent Application
Tester for pressure sensors
- Publication number 20020152794
- Publication date Oct 24, 2002
- Claus Dietrich
- G01 - MEASURING TESTING

Stefan Schneidewind

Person

Patents Grantslast 30 patents

Method for increasing the accuracy of the positioning of a first ob...

Apparatus for testing substrates

Method and prober for contacting a contact area with a contact tip

Test apparatus for testing substrates at low temperatures

Test apparatus with loading device

Substrate-holding device for testing circuit arrangements on substr...

Tester for pressure sensors

Patents Applicationslast 30 patents

Method For Increasing The Accuracy Of The Positioning Of A First Ob...

Arrangement and method for testing substrates under load

Apparatus for testing substrates

Method and prober for contacting a contact area with a contact tip

Method for increasing the accuracy of the positioning of a first ob...

Method and apparatus for testing movement-sensitive substrates

Test apparatus with loading device

Test apparatus for testing substrates at low temperatures

Substrate-holding device for testing circuit arrangements on substr...

Tester for pressure sensors