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Stefan Schoeche
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Lincoln, NE, US
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Patents Grants
last 30 patents
Information
Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
Patent number
11,821,833
Issue date
Nov 21, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
Patent number
11,740,176
Issue date
Aug 29, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Patent number
11,675,208
Issue date
Jun 13, 2023
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Methods and materials for metamaterials exhibiting form-induced bir...
Patent number
10,914,866
Issue date
Feb 9, 2021
HARRIS CORPORATION GCS
Tino Hofmann
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Method to analyze spectroscopic ellipsometry or intensity data of p...
Patent number
10,175,160
Issue date
Jan 8, 2019
J. A. Woollam Co., Inc.
Stefan Schoeche
G01 - MEASURING TESTING
Information
Patent Grant
Birefringence imaging chromatography based on highly ordered 3D nan...
Patent number
10,101,265
Issue date
Oct 16, 2018
BOARD OF REGENTS FOR THE UNIVERSITY OF NEBRASKA
Mathias M. Schubert
G01 - MEASURING TESTING
Information
Patent Grant
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...
Patent number
10,073,120
Issue date
Sep 11, 2018
Board of Regents for the University of Nebraska
Tino Hofmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method to analyze spectroscopic ellipsometry data of porous samples...
Patent number
9,976,902
Issue date
May 22, 2018
J.A. Woolam Co., Inc.
Stefan Schoeche
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Integrated mid-infrared, far infrared and terahertz optical Hall ef...
Patent number
9,851,294
Issue date
Dec 26, 2017
J. A. Woollam Co., Inc.
Tino Hofmann
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Fast and accurated mueller matrix infrared ellipsometer
Publication number
20230194414
Publication date
Jun 22, 2023
J. A. WOOLLAM CO., INC.
STEFAN SCHOECHE
G01 - MEASURING TESTING
Information
Patent Application
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
Publication number
20230184671
Publication date
Jun 15, 2023
J. A. WOOLLAM CO., INC.
STEFAN SCHOECHE
G01 - MEASURING TESTING
Information
Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
Publication number
20220244169
Publication date
Aug 4, 2022
J. A. WOOLLAM CO., INC.
Ping He
G02 - OPTICS