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Stefan Thiel
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Rosenheim, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Handler for electronic components, in particular IC'S, comprising a...
Patent number
8,684,168
Issue date
Apr 1, 2014
Multitest Elektronische Systeme GmbH
Stefan Thiel
G01 - MEASURING TESTING
Information
Patent Grant
Handler for electronic components, in particular ICs, comprising a...
Patent number
8,297,433
Issue date
Oct 30, 2012
Multitest Elektronische Systeme GmbH
Stefan Thiel
G01 - MEASURING TESTING
Information
Patent Grant
Plunger for holding and moving electronic components in particular ICS
Patent number
8,232,815
Issue date
Jul 31, 2012
Multitest Elektronische Systeme GmbH
Max Schaule
G01 - MEASURING TESTING
Information
Patent Grant
Handler for electronic components, in particular IC's, comprising c...
Patent number
8,138,779
Issue date
Mar 20, 2012
Multitest Elektronische Systeme GmbH
Stefan Thiel
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HANDLER FOR ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, COMPRISING C...
Publication number
20100315113
Publication date
Dec 16, 2010
Multitest elektronische Systeme GmbH
Stefan Thiel
G01 - MEASURING TESTING
Information
Patent Application
PLUNGER FOR HOLDING AND MOVING ELECTRONIC COMPONENTS IN PARTICULAR ICS
Publication number
20100303589
Publication date
Dec 2, 2010
Multitest elektronische Systeme GmbH
Max Schaule
G01 - MEASURING TESTING
Information
Patent Application
HANDLER FOR ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, COMPRISING A...
Publication number
20100219044
Publication date
Sep 2, 2010
Stefan Thiel
G01 - MEASURING TESTING
Information
Patent Application
HANDLER FOR ELECTRONIC COMPONENTS, IN PARTICULAR IC'S, COMPRISING A...
Publication number
20100150686
Publication date
Jun 17, 2010
Multitest Elektronische Systeme GMBH
Stefan Thiel
G01 - MEASURING TESTING