Stefano Aresu

Person

Munich, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 10,698,022
- Issue date Jun 30, 2020
- Infineon Technologies AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Capacitors in integrated circuits and methods of fabrication thereof
- Patent number 10,446,534
- Issue date Oct 15, 2019
- Infineon Technologies AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit and method for internally assessing dielectric reliability...
- Patent number 10,242,922
- Issue date Mar 26, 2019
- Infineon Technologies AG
- Michael Röhner
- G01 - MEASURING TESTING
Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 9,945,899
- Issue date Apr 17, 2018
- Infineon Technologies AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Capacitors in integrated circuits and methods of fabrication thereof
- Patent number 9,508,788
- Issue date Nov 29, 2016
- Infineon Technologies AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Testing of semiconductor devices and devices, and designs thereof
- Patent number 9,377,502
- Issue date Jun 28, 2016
- Infineon Technologies AG
- Michael Roehner
- G01 - MEASURING TESTING
Information Patent Grant
Testing of semiconductor components and circuit layouts therefor
- Patent number 9,048,150
- Issue date Jun 2, 2015
- Infineon Technologies AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Testing of Semiconductor Devices and Devices, and Designs Thereof
- Publication number 20180292450
- Publication date Oct 11, 2018
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Capacitors in Integrated Circuits and Methods of Fabrication Thereof
- Publication number 20170033095
- Publication date Feb 2, 2017
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing of Semiconductor Devices and Devices, and Designs Thereof
- Publication number 20160266197
- Publication date Sep 15, 2016
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- G01 - MEASURING TESTING
Information Patent Application
Circuit and Method for Internally Assessing Dielectric Reliability...
- Publication number 20150194358
- Publication date Jul 9, 2015
- INFINEON TECHNOLOGIES AG
- Michael Röhner
- G01 - MEASURING TESTING
Information Patent Application
Testing of Semiconductor Components and Circuit Layouts Therefor
- Publication number 20150179534
- Publication date Jun 25, 2015
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Testing of Semiconductor Devices and Devices, and Designs Thereof
- Publication number 20150177310
- Publication date Jun 25, 2015
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- G01 - MEASURING TESTING
Information Patent Application
Capacitors in Integrated Circuits and Methods of Fabrication Thereof
- Publication number 20140273394
- Publication date Sep 18, 2014
- INFINEON TECHNOLOGIES AG
- Michael Roehner
- H01 - BASIC ELECTRIC ELEMENTS

Stefano Aresu

Person

Patents Grantslast 30 patents

Testing of semiconductor devices and devices, and designs thereof

Capacitors in integrated circuits and methods of fabrication thereof

Circuit and method for internally assessing dielectric reliability...

Testing of semiconductor devices and devices, and designs thereof

Capacitors in integrated circuits and methods of fabrication thereof

Testing of semiconductor devices and devices, and designs thereof

Testing of semiconductor components and circuit layouts therefor

Patents Applicationslast 30 patents

Testing of Semiconductor Devices and Devices, and Designs Thereof

Capacitors in Integrated Circuits and Methods of Fabrication Thereof

Testing of Semiconductor Devices and Devices, and Designs Thereof

Circuit and Method for Internally Assessing Dielectric Reliability...

Testing of Semiconductor Components and Circuit Layouts Therefor

Testing of Semiconductor Devices and Devices, and Designs Thereof

Capacitors in Integrated Circuits and Methods of Fabrication Thereof