Stefano Concina

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Saratoga, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron beam microscope
- Patent number 6,570,154
- Issue date May 27, 2003
- KLA-Tencor Technologies Corporation
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam dose control for scanning electron microscopy and cri...
- Patent number 6,211,518
- Issue date Apr 3, 2001
- KLA-Tencor Corporation
- Neil Richardson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron beam microscope
- Patent number 6,066,849
- Issue date May 23, 2000
- KLA Tencor
- Douglas K. Masnaghetti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam dose control for scanning electron microscopy and cri...
- Patent number 5,869,833
- Issue date Feb 9, 1999
- KLA-Tencor Corporation
- Neil Richardson
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Systems and Methods for Determining One or More Characteristics of...
- Publication number 20120281275
- Publication date Nov 8, 2012
- KLA-Tencor Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DETERMINING ONE OR MORE CHARACTERISTICS OF...
- Publication number 20100235114
- Publication date Sep 16, 2010
- KLA-Tencor Corporation
- Ady Levy
- G01 - MEASURING TESTING