Stefano Felici

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Vertical probe head with improved contact properties towards a devi...
- Patent number 12,085,588
- Issue date Sep 10, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for reduced-pitch applications
- Patent number 11,953,522
- Issue date Apr 9, 2024
- Technoprobe S.p.A.
- Roberto Crippa
- G01 - MEASURING TESTING
Information Patent Grant
Vertical probe head having an improved contact with a device under...
- Patent number 11,867,723
- Issue date Jan 9, 2024
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Buckling beam probe arrays and methods for making such arrays inclu...
- Patent number 11,821,918
- Issue date Nov 21, 2023
- Microfabrica Inc.
- Michael S. Lockard
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high-frequency applications
- Patent number 11,112,431
- Issue date Sep 7, 2021
- Technoprobe S.p.A.
- Stefano Felici
- G01 - MEASURING TESTING
Information Patent Grant
Probe card for high-frequency applications
- Patent number 11,029,336
- Issue date Jun 8, 2021
- Technoprobe S.p.A.
- Riccardo Vettori
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Shielded Probes for Semiconductor Testing, Methods for Using, and M...
- Publication number 20240094252
- Publication date Mar 21, 2024
- Microfabrica Inc.
- Jia Li
- G01 - MEASURING TESTING
Information Patent Application
BUCKLING BEAM PROBE ARRAYS AND METHODS FOR MAKING SUCH ARRAYS INCLU...
- Publication number 20240019463
- Publication date Jan 18, 2024
- Microfabrica Inc.
- MIchael S. Lockard
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE FOR A PROBE HEAD
- Publication number 20230288447
- Publication date Sep 14, 2023
- TECHNOPROBE S.P.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR REDUCED-PITCH APPLICATIONS
- Publication number 20230021227
- Publication date Jan 19, 2023
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD HAVING AN IMPROVED CONTACT WITH A DEVICE UNDER...
- Publication number 20210318355
- Publication date Oct 14, 2021
- Technoprobe S.p.A.
- Stefano FELICI
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD WITH IMPROVED CONTACT PROPERTIES TOWARDS A DEVI...
- Publication number 20210255218
- Publication date Aug 19, 2021
- Technoprobe S.p.A.
- Stefano FELICI
- G01 - MEASURING TESTING