Stefano Palomba

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Determining information for defects on wafers
- Patent number 10,571,407
- Issue date Feb 25, 2020
- KLA-Tencor Corp.
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Grant
Determining information for defects on wafers
- Patent number 10,317,347
- Issue date Jun 11, 2019
- KLA-Tencor Corp.
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and methods for determining defect depths in vertical sta...
- Patent number 9,696,264
- Issue date Jul 4, 2017
- KLA-Tencor Corporation
- Steven R. Lange
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Determining Information for Defects on Wafers
- Publication number 20190257768
- Publication date Aug 22, 2019
- KLA-Tencor Corporation
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Application
Determining Information for Defects on Wafers
- Publication number 20150123014
- Publication date May 7, 2015
- KLA-Tencor Corporation
- Stefano Palomba
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHODS FOR DETERMINING DEFECT DEPTHS IN VERTICAL STA...
- Publication number 20140300890
- Publication date Oct 9, 2014
- KLA-Tencor Corporation
- Steven R. Lange
- G01 - MEASURING TESTING