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Stefano VESPUCCI
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Glasgow, GB
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last 30 patents
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Patent Grant
Method and system for determining the position of a radiation source
Patent number
10,234,282
Issue date
Mar 19, 2019
Brunker Nano GmbH
Aimo Winkelmann
G01 - MEASURING TESTING
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Patent Grant
Method and system for determining the position of a radiation source
Patent number
10,197,393
Issue date
Feb 5, 2019
Brunker Nano GmbH
Aimo Winkelmann
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD AND SYSTEM FOR DETERMINING THE POSITION OF A RADIATION SOURCE
Publication number
20180010909
Publication date
Jan 11, 2018
BRUKER NANO GMBH
Aimo WINKELMANN
G01 - MEASURING TESTING