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Stefano Vespucci
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Eindhoven, NL
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Patents Grants
last 30 patents
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Patent Grant
Methods and systems for acquiring three-dimensional electron diffra...
Patent number
11,815,476
Issue date
Nov 14, 2023
FEI Company
Bart Buijsse
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for simultaneous phase contrast imaging and elect...
Patent number
11,211,223
Issue date
Dec 28, 2021
FEI Company
Ivan Lazić
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
METHODS AND SYSTEMS FOR DETERMINING THE ABSOLUTE STRUCTURE OF CRYSTAL
Publication number
20240077436
Publication date
Mar 7, 2024
FEI Company
Stefano VESPUCCI
G01 - MEASURING TESTING
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Patent Application
METHODS AND SYSTEMS FOR ACQUIRING THREE-DIMENSIONAL ELECTRON DIFFRA...
Publication number
20220317066
Publication date
Oct 6, 2022
FEI Company
Bart BUIJSSE
H01 - BASIC ELECTRIC ELEMENTS