Steffen F. Schulze

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Sherwood, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Generalization of shot definitions for mask and wafer writing tools
- Patent number 9,448,481
- Issue date Sep 20, 2016
- Mentor Graphics Corporation
- Emile Y. Sahouria
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Generalization of shot definitions for mask and wafer writing tools
- Patent number 9,134,616
- Issue date Sep 15, 2015
- Mentor Graphics Corporation
- Emile Y. Sahouria
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Generalization of shot definitions for mask and wafer writing tools
- Patent number 8,815,473
- Issue date Aug 26, 2014
- Emile Y. Sahouria
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of inspecting a mask or reticle for detecting a defect, and...
- Patent number 7,221,788
- Issue date May 22, 2007
- Infineon Technologies AG
- Steffen Schulze
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for the repair of defects in photolithographic masks for pat...
- Patent number 7,150,946
- Issue date Dec 19, 2006
- Infineon Technologies AG
- Steffen F. Schulze
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Generalization Of Shot Definitions For Mask And Wafer Writing Tools
- Publication number 20160133458
- Publication date May 12, 2016
- Mentor Graphics Corporation
- Emile Y. Sahouria
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Controllable Turn-Around Time For Post Tape-Out Flow
- Publication number 20140040848
- Publication date Feb 6, 2014
- Mentor Graphics Corporation
- Toshikazu Endo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Generalization Of Shot Definitions For Mask And Wafer Writing Tools
- Publication number 20130071776
- Publication date Mar 21, 2013
- Emile Y. Sahouria
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method for the repair of defects in photolithographic masks for pat...
- Publication number 20050153213
- Publication date Jul 14, 2005
- Steffen F. Schulze
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of inspecting a mask or reticle for detecting a defect, and...
- Publication number 20050002554
- Publication date Jan 6, 2005
- Steffen Schulze
- G06 - COMPUTING CALCULATING COUNTING