Steffen Gappisch

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Zuerich, CH

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Patents Grantslast 30 patents

Information Patent Grant
Non-volatile memory and accelerated test method for address decoder...
- Patent number 7,664,998
- Issue date Feb 16, 2010
- NXP B.V.
- Steffen Gappisch
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-volatile memory arrangement and method in a multiprocessor device
- Patent number 7,565,563
- Issue date Jul 21, 2009
- NXP B.V.
- Steffen Gappisch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arrangement for testing integrated circuits
- Patent number 7,493,542
- Issue date Feb 17, 2009
- NXP B.V.
- Georg Farkas
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with self-test device for an embedded non-volati...
- Patent number 6,876,591
- Issue date Apr 5, 2005
- Koninklijke Philips Electronics N.V.
- Steffen Gappisch
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit with flash memory including dedicated flash bus...
- Patent number 6,735,661
- Issue date May 11, 2004
- Koninklijke Philips Electronics N.V.
- Hans-Joachim Gelke
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Non-volatile memory and accelerated test method for address decoder...
- Publication number 20040188716
- Publication date Sep 30, 2004
- Steffen Gappisch
- G11 - INFORMATION STORAGE
Information Patent Application
Circuit configuration
- Publication number 20030081708
- Publication date May 1, 2003
- Hans-Joachim Gelke
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Error correction scheme for use in flash memory allowing bit altera...
- Publication number 20030046631
- Publication date Mar 6, 2003
- Steffen Gappisch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Non-volatile memory arrangement and method in a multiprocessor device
- Publication number 20030033490
- Publication date Feb 13, 2003
- Steffen Gappisch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Arrangement for testing integrated circuits
- Publication number 20020047723
- Publication date Apr 25, 2002
- Georg Farkas
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with flash bridge and autoload
- Publication number 20020013880
- Publication date Jan 31, 2002
- Steffen Gappisch
- G11 - INFORMATION STORAGE
Information Patent Application
Integrated circuit with flash
- Publication number 20020013874
- Publication date Jan 31, 2002
- Hans-Joachim Gelke
- G06 - COMPUTING CALCULATING COUNTING