Steffen Ludwig

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Imaging device with alignment analysis
- Patent number 10,397,565
- Issue date Aug 27, 2019
- Fluke Corporation
- Jeffrey M. Kresch
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device with alignment analysis
- Patent number 9,924,160
- Issue date Mar 20, 2018
- Fluke Corporation
- Jeffrey M. Kresch
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and system for measuring thermal radiation to determine temp...
- Patent number 8,483,991
- Issue date Jul 9, 2013
- Fluke Corporation
- Reno Gaertner
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGING DEVICE WITH ALIGNMENT ANALYSIS
- Publication number 20180213221
- Publication date Jul 26, 2018
- FLUKE CORPORATION
- Jeffrey M. Kresch
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGING DEVICE WITH ALIGNMENT ANALYSIS
- Publication number 20180084246
- Publication date Mar 22, 2018
- FLUKE CORPORATION
- Jeffrey M. Kresch
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMP...
- Publication number 20100292951
- Publication date Nov 18, 2010
- FLUKE CORPORATION
- Reno Gaertner
- G01 - MEASURING TESTING