Steffen Schott

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Dresden, DE

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Patents Grantslast 30 patents

Information Patent Grant
Chuck for supporting and retaining a test substrate and a calibrati...
- Patent number 8,680,879
- Issue date Mar 25, 2014
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer having more...
- Patent number 7,768,271
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a vectorial network analyzer
- Patent number 7,769,555
- Issue date Aug 3, 2010
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for positioning of contact tips
- Patent number 7,463,044
- Issue date Dec 9, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Grant
Test probe for high-frequency measurement
- Patent number 7,332,923
- Issue date Feb 19, 2008
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20110291680
- Publication date Dec 1, 2011
- Cascade Microtech, Inc.
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
CHUCK FOR SUPPORTING AND RETAINING A TEST SUBSTRATE AND A CALIBRATI...
- Publication number 20090315581
- Publication date Dec 24, 2009
- SUSS MicroTec Test Systems GmbH
- Andrej RUMIANTSEV
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER
- Publication number 20080125999
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CALIBRATION OF A VECTORIAL NETWORK ANALYZER HAVING MORE...
- Publication number 20080122451
- Publication date May 29, 2008
- SUSS MicroTec Test Systems GmbH
- Andrej Rumiantsev
- G01 - MEASURING TESTING
Information Patent Application
ADAPTER FOR POSITIONING OF CONTACT TIPS
- Publication number 20070296402
- Publication date Dec 27, 2007
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING
Information Patent Application
Test probe for high-frequency measurement
- Publication number 20070145987
- Publication date Jun 28, 2007
- SUSS MicroTec Test Systems GmbH
- Steffen Schott
- G01 - MEASURING TESTING