Membership
Tour
Register
Log in
Stein LIAN
Follow
Person
Kvaloya, NO
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Biomarkers for diagnosing implant related risk of implant revision...
Patent number
12,203,940
Issue date
Jan 21, 2025
Lyfstone B.V.
Stein Lian
G01 - MEASURING TESTING
Information
Patent Grant
Biomarkers for diagnosing implant related risk of implant revision...
Patent number
12,146,885
Issue date
Nov 19, 2024
Lyfstone B.V.
Stein Lian
G01 - MEASURING TESTING
Information
Patent Grant
Biomarkers for diagnosing implant related risk of implant revision...
Patent number
11,402,389
Issue date
Aug 2, 2022
LYFSTONE AS
Stein Lian
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
BIOMARKERS FOR DIAGNOSING IMPLANT RELATED RISK OF IMPLANT REVISION...
Publication number
20230160910
Publication date
May 25, 2023
Lyfstone B.V.
Stein LIAN
G01 - MEASURING TESTING
Information
Patent Application
BIOMARKERS FOR DIAGNOSING IMPLANT RELATED RISK OF IMPLANT REVISION...
Publication number
20230081885
Publication date
Mar 16, 2023
Lyfstone B.V.
Stein LIAN
G01 - MEASURING TESTING
Information
Patent Application
BIOMARKERS FOR DIAGNOSING IMPLANT RELATED RISK OF IMPLANT REVISION...
Publication number
20190361035
Publication date
Nov 28, 2019
ORTHOGENICS AS
Stein LIAN
G01 - MEASURING TESTING