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Stephan Beer
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Schaffhausen, CH
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Patents Grants
last 30 patents
Information
Patent Grant
Time-of-flight module and method to determine distance to object
Patent number
11,774,563
Issue date
Oct 3, 2023
ams International AG
Stephan Beer
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,543,505
Issue date
Jan 3, 2023
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
11,536,815
Issue date
Dec 27, 2022
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules operable to recognize spurious reflections a...
Patent number
10,705,192
Issue date
Jul 7, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Grant
Optoelectronic modules for the acquisition of spectral and distance...
Patent number
10,578,739
Issue date
Mar 3, 2020
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical imaging modules and optical detection modules including a t...
Patent number
10,359,505
Issue date
Jul 23, 2019
ams Sensors Singapore Pte. Ltd.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Grant
Time-of-fight pixel including in-pixel buried channel transistors
Patent number
10,276,628
Issue date
Apr 30, 2019
ams Sensors Singapore Pte. Ltd.
Radoslaw Marcin Gancarz
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Quantum dot film based demodulation structures
Patent number
10,236,400
Issue date
Mar 19, 2019
Heptagon Micro Optics Pte. Ltd.
Daniel Furrer
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Sensing system
Publication number
20230130040
Publication date
Apr 27, 2023
ams International AG
Miguel Bruno VAELLO PAÑOS
G01 - MEASURING TESTING
Information
Patent Application
A METHOD OF MEASURING A DISTANCE FROM A TARGET
Publication number
20220206146
Publication date
Jun 30, 2022
ams Sensors Asia Pte. Ltd.
Stephan Beer
G01 - MEASURING TESTING
Information
Patent Application
DISTANCE TIME-OF-FLIGHT MODULES
Publication number
20210156976
Publication date
May 27, 2021
ams International AG
Stephan BEER
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319320
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20200319321
Publication date
Oct 8, 2020
ams Sensors Singapore Pte. Ltd.
Jens Kubacki
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES FOR THE ACQUISITION OF SPECTRAL AND DISTANCE...
Publication number
20180284273
Publication date
Oct 4, 2018
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
TIME-OF-FIGHT PIXEL INCLUDING IN-PIXEL BURIED CHANNEL TRANSISTORS
Publication number
20170338274
Publication date
Nov 23, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Radoslaw Marcin Gancarz
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
QUANTUM DOT FILM BASED DEMODULATION STRUCTURES
Publication number
20170222076
Publication date
Aug 3, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Daniel Furrer
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC DEVICE INCLUDING EVENT-DRIVEN PHOTO-ARRAY AND METHOD...
Publication number
20170153107
Publication date
Jun 1, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Stephan Beer
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL IMAGING MODULES AND OPTICAL DETECTION MODULES INCLUDING A T...
Publication number
20170090018
Publication date
Mar 30, 2017
HEPTAGON MICRO OPTICS PTE. LTD.
Bernhard Buettgen
G01 - MEASURING TESTING
Information
Patent Application
OPTOELECTRONIC MODULES OPERABLE TO RECOGNIZE SPURIOUS REFLECTIONS A...
Publication number
20170038459
Publication date
Feb 9, 2017
Heptogaon Micro Optics Pte Ltd.
Jens Kubacki
G01 - MEASURING TESTING