Stephan Kujawa

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Veldhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of studying a sample in an ETEM
- Patent number 9,658,246
- Issue date May 23, 2017
- FEI Company
- Stan Johan Pieter Konings
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Laser Thermal Epitaxy in a Charged Particle Microscope
- Publication number 20240161999
- Publication date May 16, 2024
- FEI Company
- Rudolf Geurink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF STUDYING A SAMPLE IN AN ETEM
- Publication number 20130040400
- Publication date Feb 14, 2013
- FEI Company
- Stan Johan Pieter Konings
- B82 - NANO-TECHNOLOGY