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Stephan Marauska
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Kaltenkirchen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
System with magnetic field shield structure
Patent number
11,486,742
Issue date
Nov 1, 2022
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor, system, and oblique incident deposition fabr...
Patent number
11,280,855
Issue date
Mar 22, 2022
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic field sensor system and method for rotation angle measurement
Patent number
10,914,611
Issue date
Feb 9, 2021
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
System and method for angle sensing using magnet having asymmetric...
Patent number
10,914,609
Issue date
Feb 9, 2021
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
Angular sensor system and method of stray field cancellation
Patent number
10,816,363
Issue date
Oct 27, 2020
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Grant
Stray magnetic field robust magnetic field sensor and system
Patent number
10,718,825
Issue date
Jul 21, 2020
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive sensor with stray field cancellation and systems i...
Patent number
10,591,320
Issue date
Mar 17, 2020
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Grant
Magnetoresistive sensor systems with stray field cancellation utili...
Patent number
10,509,082
Issue date
Dec 17, 2019
NXP B.V.
Jan Przytarski
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Magnetic field sensor with magnetic field shield structure and syst...
Patent number
10,261,138
Issue date
Apr 16, 2019
NXP B.V.
Stephan Marauska
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
LISSAJOUS MICROSCANNER HAVING CENTRAL MIRROR MOUNT AND METHOD FOR P...
Publication number
20240295731
Publication date
Sep 5, 2024
OQMENTED GMBH
Ulrich HOFMANN
G02 - OPTICS
Information
Patent Application
MICRO-ELECTROMECHANICAL SYSTEMS (MEMS) DEVICE AND NOISE CANCELLATIO...
Publication number
20230365401
Publication date
Nov 16, 2023
Huawei Technologies Co., Ltd
Ulrich HOFMANN
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MICROMECHANICAL RESONATOR ASSEMBLY WITH EXTERNAL ACTUATOR
Publication number
20230359023
Publication date
Nov 9, 2023
Huawei Technologies Co., Ltd
Stephan MARAUSKA
G02 - OPTICS
Information
Patent Application
MICROMECHANICAL RESONATOR WAFER ASSEMBLY AND METHOD OF FABRICATION...
Publication number
20230359019
Publication date
Nov 9, 2023
Huawei Technologies Co., Ltd
Thomas Knieling
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
DEFLECTION DEVICE WITH A MIRROR FOR USE IN SCANNER TECHNICAL FIELD
Publication number
20230359022
Publication date
Nov 9, 2023
Huawei Technologies Co., Ltd
Frank Senger
G02 - OPTICS
Information
Patent Application
GLASS-SUBSTRATE-BASED MEMS MIRROR DEVICE AND METHOD FOR ITS PRODUCTION
Publication number
20230244076
Publication date
Aug 3, 2023
OQMENTED GMBH
Stephan MARAUSKA
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYSTEM WITH MAGNETIC FIELD SHIELD STRUCTURE
Publication number
20210048320
Publication date
Feb 18, 2021
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR, SYSTEM, AND OBLIQUE INCIDENT DEPOSITION FABR...
Publication number
20210033685
Publication date
Feb 4, 2021
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
SENSOR PACKAGE WITH INTEGRATED MAGNETIC SHIELD STRUCTURE
Publication number
20200158791
Publication date
May 21, 2020
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR SYSTEM AND METHOD FOR ROTATION ANGLE MEASUREMENT
Publication number
20200064157
Publication date
Feb 27, 2020
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR ANGLE SENSING USING MAGNET HAVING ASYMMETRIC...
Publication number
20190383644
Publication date
Dec 19, 2019
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
ANGULAR SENSOR SYSTEM AND METHOD OF STRAY FIELD CANCELLATION
Publication number
20190265071
Publication date
Aug 29, 2019
NXP B.V.
Jaap Ruigrok
G01 - MEASURING TESTING
Information
Patent Application
MAGNETORESISTIVE SENSOR SYSTEMS WITH STRAY FIELD CANCELLATION UTILI...
Publication number
20190242956
Publication date
Aug 8, 2019
NXP B.V.
Jan Przytarski
B82 - NANO-TECHNOLOGY
Information
Patent Application
MAGNETORESISTIVE SENSOR WITH STRAY FIELD CANCELLATION AND SYSTEMS I...
Publication number
20190178684
Publication date
Jun 13, 2019
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
STRAY MAGNETIC FIELD ROBUST MAGNETIC FIELD SENSOR AND SYSTEM
Publication number
20190079141
Publication date
Mar 14, 2019
NXP B.V.
Stephan Marauska
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC FIELD SENSOR WITH MAGNETIC FIELD SHIELD STRUCTURE AND SYST...
Publication number
20190018080
Publication date
Jan 17, 2019
NXP B.V.
Stephan Marauska
H01 - BASIC ELECTRIC ELEMENTS