Stephan Maximilian Altmann

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Grafenwohr, DE

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Patents Grantslast 30 patents

Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,312,619
- Issue date Dec 25, 2007
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 7,098,678
- Issue date Aug 29, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,943,574
- Issue date Sep 13, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,583,411
- Issue date Jun 24, 2003
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Grant
Multiple local probe measuring device and method
- Patent number 6,545,492
- Issue date Apr 8, 2003
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Multiple local probe measuring device and method
- Publication number 20060255818
- Publication date Nov 16, 2006
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050184746
- Publication date Aug 25, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maxmilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20050040836
- Publication date Feb 24, 2005
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- G01 - MEASURING TESTING
Information Patent Application
Multiple local probe measuring device and method
- Publication number 20030020500
- Publication date Jan 30, 2003
- Europaisches Laboratorium fur Molekularbiologie (EMBL)
- Stephan Maximilian Altmann
- B82 - NANO-TECHNOLOGY