Stephan Uhlemann

Person

Darmstadt, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Particle-optical corrector which is free from axial aberrations of...
- Patent number 11,081,313
- Issue date Aug 3, 2021
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,673,024
- Issue date Jun 6, 2017
- Applied Materials Israel, Ltd.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 9,224,576
- Issue date Dec 29, 2015
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 8,637,834
- Issue date Jan 28, 2014
- Carl Zeiss Microscopy GmbH
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Corrector
- Patent number 8,362,442
- Issue date Jan 29, 2013
- CEOS Corrected Electron Optical Systems GmbH
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 8,097,847
- Issue date Jan 17, 2012
- Carl Ziess SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron-optical corrector for an aplanatic imaging system
- Patent number 7,800,074
- Issue date Sep 21, 2010
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical corrector for aplanatic imaging systems
- Patent number 7,800,076
- Issue date Sep 21, 2010
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and radiation source with monochromator
- Patent number 7,745,783
- Issue date Jun 29, 2010
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical systems and arrangements and particle-optical comp...
- Patent number 7,554,094
- Issue date Jun 30, 2009
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Beam guiding arrangement, imaging method, electron microscopy syste...
- Patent number 7,135,677
- Issue date Nov 14, 2006
- Carl Zeiss NTS GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lens array with a laterally movable optical axis for corpuscular rays
- Patent number 6,995,378
- Issue date Feb 7, 2006
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Examining system for the particle-optical imaging of an object, def...
- Patent number 6,903,337
- Issue date Jun 7, 2005
- Carl Zeiss SMT AG
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic corrector
- Patent number 6,836,372
- Issue date Dec 28, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic corrector for eliminating the chromatic aberration of...
- Patent number 6,797,962
- Issue date Sep 28, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron/ion gun for electron or ion beams with high monochromasy o...
- Patent number 6,770,878
- Issue date Aug 3, 2004
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for eliminating first, second and third-order axial image de...
- Patent number 6,646,267
- Issue date Nov 11, 2003
- Maximilian Haider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device for correcting third-order spherical aberration in a lens, e...
- Patent number 6,605,810
- Issue date Aug 12, 2003
- Maximilian Haider
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging electron energy filter
- Patent number 5,449,914
- Issue date Sep 12, 1995
- Carl-Zeiss-Stiftung
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Particle-optical corrector which is free from axial aberrations of...
- Publication number 20210050179
- Publication date Feb 18, 2021
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20170287674
- Publication date Oct 5, 2017
- CARL ZEISS MICROSCOPY GMBH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...
- Publication number 20160111251
- Publication date Apr 21, 2016
- Carl Zeiss Microscopy GmbH
- Rainer KNIPPELMEYER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20140158902
- Publication date Jun 12, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Corrector
- Publication number 20120153147
- Publication date Jun 21, 2012
- Joachim Zach
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-Optical Systems and Arrangements and Particle-Optical Comp...
- Publication number 20120104252
- Publication date May 3, 2012
- Applied Materials Israel Ltd.
- Rainer KNIPPELMEYER
- B82 - NANO-TECHNOLOGY
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20100181479
- Publication date Jul 22, 2010
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
ELECTRON-OPTICAL CORRECTOR FOR APLANATIC IMAGING SYSTEMS
- Publication number 20090134339
- Publication date May 28, 2009
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monochromator and radiation source with monochromator
- Publication number 20080290273
- Publication date Nov 27, 2008
- CEOS Corrected Electron Optical Systems GmbH
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron-Optical Corrector for an Aplanatic Imaging System
- Publication number 20080265172
- Publication date Oct 30, 2008
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle-optical systems and arrangements and particle-optical comp...
- Publication number 20080054184
- Publication date Mar 6, 2008
- Carl Zeiss SMT AG
- Rainer Knippelmeyer
- B82 - NANO-TECHNOLOGY
Information Patent Application
Lens array with a laterally movable optical axis for corpuscular rays
- Publication number 20050035299
- Publication date Feb 17, 2005
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Beam guiding arrangement, imaging method, electron microscopy syste...
- Publication number 20040084621
- Publication date May 6, 2004
- LEO Elektronenmikroskopie GmbH
- Oliver Kienzle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electrostatic corrector
- Publication number 20040051985
- Publication date Mar 18, 2004
- Harald Rose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron/ion gun for electron or ion beams with high monochromasy o...
- Publication number 20030098414
- Publication date May 29, 2003
- Stephan Uhlemann
- H01 - BASIC ELECTRIC ELEMENTS

Stephan Uhlemann

Person

Patents Grantslast 30 patents

Particle-optical corrector which is free from axial aberrations of...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Particle-optical systems and arrangements and particle-optical comp...

Corrector

Particle-optical systems and arrangements and particle-optical comp...

Electron-optical corrector for an aplanatic imaging system

Electron-optical corrector for aplanatic imaging systems

Monochromator and radiation source with monochromator

Particle-optical systems and arrangements and particle-optical comp...

Beam guiding arrangement, imaging method, electron microscopy syste...

Lens array with a laterally movable optical axis for corpuscular rays

Examining system for the particle-optical imaging of an object, def...

Electrostatic corrector

Electrostatic corrector for eliminating the chromatic aberration of...

Electron/ion gun for electron or ion beams with high monochromasy o...

Method for eliminating first, second and third-order axial image de...

Device for correcting third-order spherical aberration in a lens, e...

Imaging electron energy filter

Patents Applicationslast 30 patents

Particle-optical corrector which is free from axial aberrations of...

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

PARTICLE-OPTICAL SYSTEMS AND ARRANGEMENTS AND PARTICLE-OPTICAL COMP...

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

Corrector

Particle-Optical Systems and Arrangements and Particle-Optical Comp...

Particle-optical systems and arrangements and particle-optical comp...

ELECTRON-OPTICAL CORRECTOR FOR APLANATIC IMAGING SYSTEMS

Monochromator and radiation source with monochromator

Electron-Optical Corrector for an Aplanatic Imaging System

Particle-optical systems and arrangements and particle-optical comp...

Lens array with a laterally movable optical axis for corpuscular rays

Beam guiding arrangement, imaging method, electron microscopy syste...

Electrostatic corrector

Electron/ion gun for electron or ion beams with high monochromasy o...